Precipitation of Ge nanoparticles from GeO2 glasses in transmission electron microscope

Nan Jiang, Jianrong Qiu, John C.H. Spence

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

We show, using spatially resolved energy loss spectroscopy in a transmission electron microscopy (TEM), that GeO2 and GeO2 - SiO2 glasses are extremely sensitive to high energy electrons. Ge nanoparticles can be precipitated in GeO2 glasses efficiently by the high-energy electron beam of a TEM. This is relevant to TEM characterization of luminescent Ge nanoparticles in silicate glasses, which may produce artificial results.

Original languageEnglish (US)
Article number143112
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume86
Issue number14
DOIs
StatePublished - Apr 4 2005
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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