Power reduction of functional units considering temperature and process variations

Deepa Kannan; Aviral Shrivastava; Sarvesh Bhardwaj; Sarma Vrudhula

doi:10.1109/VLSI.2008.81

Power reduction of functional units considering temperature and process variations

Deepa Kannan, Aviral Shrivastava, Sarvesh Bhardwaj, Sarma Vrudhula

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured processors. Both power density and process variations have a significant impact on the leakage power. Therefore, power optimization techniques should be sensitive to the variation in leakage power due to both temperature as well as process variations. Operation to Functional Units Binding Mechanism (OFBM) is the mechanism to dynamically issue operations to Functional Units (FUs) in superscalar processors. We propose a Leakage-Aware OFBM (LA-OFBM), which is both temperature and process variation aware. Our experimental results demostrate that LA-OFBM reduces the mean and standard deviation of the total energy consumption of ALUs by 18%, and 46% respectively, as compared to the traditional OFBM, without any performance penalty.

Original language	English (US)
Title of host publication	Proceedings - 21st International Conference on VLSI Design, VLSI DESIGN 2008
Pages	533-538
Number of pages	6
DOIs	https://doi.org/10.1109/VLSI.2008.81
State	Published - 2008
Event	21st International Conference on VLSI Design, VLSI DESIGN 2008 - Hyderabad, India Duration: Jan 4 2008 → Jan 8 2008

Publication series

Name	Proceedings of the IEEE International Frequency Control Symposium and Exposition

Other

Other	21st International Conference on VLSI Design, VLSI DESIGN 2008
Country/Territory	India
City	Hyderabad
Period	1/4/08 → 1/8/08

ASJC Scopus subject areas

General Engineering

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10.1109/VLSI.2008.81

Cite this

Kannan, D., Shrivastava, A., Bhardwaj, S., & Vrudhula, S. (2008). Power reduction of functional units considering temperature and process variations. In Proceedings - 21st International Conference on VLSI Design, VLSI DESIGN 2008 (pp. 533-538). Article 4450554 (Proceedings of the IEEE International Frequency Control Symposium and Exposition). https://doi.org/10.1109/VLSI.2008.81

Power reduction of functional units considering temperature and process variations. / Kannan, Deepa; Shrivastava, Aviral; Bhardwaj, Sarvesh et al.
Proceedings - 21st International Conference on VLSI Design, VLSI DESIGN 2008. 2008. p. 533-538 4450554 (Proceedings of the IEEE International Frequency Control Symposium and Exposition).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kannan, D, Shrivastava, A, Bhardwaj, S & Vrudhula, S 2008, Power reduction of functional units considering temperature and process variations. in Proceedings - 21st International Conference on VLSI Design, VLSI DESIGN 2008., 4450554, Proceedings of the IEEE International Frequency Control Symposium and Exposition, pp. 533-538, 21st International Conference on VLSI Design, VLSI DESIGN 2008, Hyderabad, India, 1/4/08. https://doi.org/10.1109/VLSI.2008.81

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Power reduction of functional units considering temperature and process variations

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