TY - GEN
T1 - Power and Thermal Analysis of Commercial Mobile Platforms
T2 - 22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
AU - Bhat, Ganapati
AU - Gumussoy, Suat
AU - Ogras, Umit Y.
N1 - Funding Information:
Acknowledgments: This work was supported in part by National Science Foundation (NSF) grant CNS-1526562 and Semiconductor Research Corporation (SRC) task 2721.001.
Publisher Copyright:
© 2019 EDAA.
PY - 2019/5/14
Y1 - 2019/5/14
N2 - State-of-the-art mobile processors can deliver fast response time and high throughput to maximize the user experience. However, high performance comes at the expense of larger power density, which leads to higher skin temperatures. Since this can degrade the user experience, there is a strong need for power consumption and thermal analysis in mobile processors. In this paper, we first perform experiments on the Nexus 6P phone to study the power, performance and thermal behavior of modern smartphones. Using the insight from these experiments, we propose a control algorithm that throttles select applications without affecting other apps. We demonstrate our governor on the Exynos 5422 processor employed in the Odroid-XU3 board.
AB - State-of-the-art mobile processors can deliver fast response time and high throughput to maximize the user experience. However, high performance comes at the expense of larger power density, which leads to higher skin temperatures. Since this can degrade the user experience, there is a strong need for power consumption and thermal analysis in mobile processors. In this paper, we first perform experiments on the Nexus 6P phone to study the power, performance and thermal behavior of modern smartphones. Using the insight from these experiments, we propose a control algorithm that throttles select applications without affecting other apps. We demonstrate our governor on the Exynos 5422 processor employed in the Odroid-XU3 board.
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U2 - 10.23919/DATE.2019.8714831
DO - 10.23919/DATE.2019.8714831
M3 - Conference contribution
AN - SCOPUS:85066637336
T3 - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
SP - 144
EP - 149
BT - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 March 2019 through 29 March 2019
ER -