Potential induced degradation (PID) study on accelerated stress tested PV modules

Sandhya Goranti; Govindasamy Tamizhmani

doi:10.1109/PVSC.2012.6318088

Potential induced degradation (PID) study on accelerated stress tested PV modules

Sandhya Goranti, Govindasamy Tamizhmani

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

13 Scopus citations

Abstract

High system voltage could increase the leakage current from the active cells/circuit to the grounded module frame. The leakage current could then lead to performance degradation, called potential induced degradation (PID). This study presents the PID results obtained on the fresh modules as well as the modules which were previously subjected to accelerated damp heat test (85°C/85%rh; 1 hours) and thermal cycling test (-40°C to 85°C; 200 cycles). The PID test was conducted in an environmental chamber by stressing the modules at 85°C, for up to 35 hours at +600V or 600V. Electrical performance and electroluminescence studies were also carried out on the pre- and post-PID tested modules.

Original language	English (US)
Title of host publication	Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Pages	2438-2441
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2012.6318088
State	Published - Nov 26 2012
Event	38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States Duration: Jun 3 2012 → Jun 8 2012

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Country/Territory	United States
City	Austin, TX
Period	6/3/12 → 6/8/12

Keywords

durability
grounding
potential induced degradation
reliability
system voltage

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2012.6318088

Cite this

Potential induced degradation (PID) study on accelerated stress tested PV modules. / Goranti, Sandhya; Tamizhmani, Govindasamy.

Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. p. 2438-2441 6318088 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Goranti, S & Tamizhmani, G 2012, Potential induced degradation (PID) study on accelerated stress tested PV modules. in Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012., 6318088, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 2438-2441, 38th IEEE Photovoltaic Specialists Conference, PVSC 2012, Austin, TX, United States, 6/3/12. https://doi.org/10.1109/PVSC.2012.6318088

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abstract = "High system voltage could increase the leakage current from the active cells/circuit to the grounded module frame. The leakage current could then lead to performance degradation, called potential induced degradation (PID). This study presents the PID results obtained on the fresh modules as well as the modules which were previously subjected to accelerated damp heat test (85°C/85%rh; 1 hours) and thermal cycling test (-40°C to 85°C; 200 cycles). The PID test was conducted in an environmental chamber by stressing the modules at 85°C, for up to 35 hours at +600V or 600V. Electrical performance and electroluminescence studies were also carried out on the pre- and post-PID tested modules.",

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AB - High system voltage could increase the leakage current from the active cells/circuit to the grounded module frame. The leakage current could then lead to performance degradation, called potential induced degradation (PID). This study presents the PID results obtained on the fresh modules as well as the modules which were previously subjected to accelerated damp heat test (85°C/85%rh; 1 hours) and thermal cycling test (-40°C to 85°C; 200 cycles). The PID test was conducted in an environmental chamber by stressing the modules at 85°C, for up to 35 hours at +600V or 600V. Electrical performance and electroluminescence studies were also carried out on the pre- and post-PID tested modules.

KW - durability

KW - grounding

KW - potential induced degradation

KW - reliability

KW - system voltage

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Potential induced degradation (PID) study on accelerated stress tested PV modules

Abstract

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Keywords

ASJC Scopus subject areas

Access to Document

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