Potential induced degradation (PID) study on accelerated stress tested PV modules

Sandhya Goranti, Govindasamy Tamizhmani

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    9 Scopus citations

    Abstract

    High system voltage could increase the leakage current from the active cells/circuit to the grounded module frame. The leakage current could then lead to performance degradation, called potential induced degradation (PID). This study presents the PID results obtained on the fresh modules as well as the modules which were previously subjected to accelerated damp heat test (85°C/85%rh; 1 hours) and thermal cycling test (-40°C to 85°C; 200 cycles). The PID test was conducted in an environmental chamber by stressing the modules at 85°C, for up to 35 hours at +600V or 600V. Electrical performance and electroluminescence studies were also carried out on the pre- and post-PID tested modules.

    Original languageEnglish (US)
    Title of host publicationProgram - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
    Pages2438-2441
    Number of pages4
    DOIs
    StatePublished - Nov 26 2012
    Event38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States
    Duration: Jun 3 2012Jun 8 2012

    Publication series

    NameConference Record of the IEEE Photovoltaic Specialists Conference
    ISSN (Print)0160-8371

    Other

    Other38th IEEE Photovoltaic Specialists Conference, PVSC 2012
    CountryUnited States
    CityAustin, TX
    Period6/3/126/8/12

    Keywords

    • durability
    • grounding
    • potential induced degradation
    • reliability
    • system voltage

    ASJC Scopus subject areas

    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering
    • Electrical and Electronic Engineering

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  • Cite this

    Goranti, S., & Tamizhmani, G. (2012). Potential induced degradation (PID) study on accelerated stress tested PV modules. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 (pp. 2438-2441). [6318088] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2012.6318088