Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers

Max O. Wiedorn, Salah Awel, Andrew J. Morgan, Miriam Barthelmess, Richard Bean, Kenneth R. Beyerlein, Leonard M.G. Chavas, Niko Eckerskorn, Holger Fleckenstein, Michael Heymann, Daniel A. Horke, Juraj Knoška, Valerio Mariani, Dominik Oberthür, Nils Roth, Oleksandr Yefanov, Anton Barty, Saša Bajt, Jochen Küpper, Andrei V. RodeRichard Kirian, Henry N. Chapman

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.Diffraction experiments with weakly scattering samples often suffer from a low signal-to-noise ratio due to unwanted background scatter. Improving the signal-to-noise ratio for single-particle imaging experiments is particularly important as the diffraction signal is very weak. Here, a simple way to minimize the background scattering by placing an aperture downstream of the sample is demonstrated.

Original languageEnglish (US)
Pages (from-to)1296-1298
Number of pages3
JournalJournal of Synchrotron Radiation
Volume24
Issue number6
DOIs
StatePublished - Nov 1 2017

Fingerprint

X ray lasers
Free electron lasers
free electron lasers
Diffraction
apertures
Scattering
scattering
diffraction
Signal to noise ratio
signal to noise ratios
x rays
Experiments
Imaging techniques
X rays

Keywords

  • aperture
  • background scattering
  • coherent diffractive imaging
  • signal-to-noise ratio
  • single-particle imaging
  • X-ray diffraction

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Wiedorn, M. O., Awel, S., Morgan, A. J., Barthelmess, M., Bean, R., Beyerlein, K. R., ... Chapman, H. N. (2017). Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. Journal of Synchrotron Radiation, 24(6), 1296-1298. https://doi.org/10.1107/S1600577517011961

Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. / Wiedorn, Max O.; Awel, Salah; Morgan, Andrew J.; Barthelmess, Miriam; Bean, Richard; Beyerlein, Kenneth R.; Chavas, Leonard M.G.; Eckerskorn, Niko; Fleckenstein, Holger; Heymann, Michael; Horke, Daniel A.; Knoška, Juraj; Mariani, Valerio; Oberthür, Dominik; Roth, Nils; Yefanov, Oleksandr; Barty, Anton; Bajt, Saša; Küpper, Jochen; Rode, Andrei V.; Kirian, Richard; Chapman, Henry N.

In: Journal of Synchrotron Radiation, Vol. 24, No. 6, 01.11.2017, p. 1296-1298.

Research output: Contribution to journalArticle

Wiedorn, MO, Awel, S, Morgan, AJ, Barthelmess, M, Bean, R, Beyerlein, KR, Chavas, LMG, Eckerskorn, N, Fleckenstein, H, Heymann, M, Horke, DA, Knoška, J, Mariani, V, Oberthür, D, Roth, N, Yefanov, O, Barty, A, Bajt, S, Küpper, J, Rode, AV, Kirian, R & Chapman, HN 2017, 'Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers', Journal of Synchrotron Radiation, vol. 24, no. 6, pp. 1296-1298. https://doi.org/10.1107/S1600577517011961
Wiedorn, Max O. ; Awel, Salah ; Morgan, Andrew J. ; Barthelmess, Miriam ; Bean, Richard ; Beyerlein, Kenneth R. ; Chavas, Leonard M.G. ; Eckerskorn, Niko ; Fleckenstein, Holger ; Heymann, Michael ; Horke, Daniel A. ; Knoška, Juraj ; Mariani, Valerio ; Oberthür, Dominik ; Roth, Nils ; Yefanov, Oleksandr ; Barty, Anton ; Bajt, Saša ; Küpper, Jochen ; Rode, Andrei V. ; Kirian, Richard ; Chapman, Henry N. / Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. In: Journal of Synchrotron Radiation. 2017 ; Vol. 24, No. 6. pp. 1296-1298.
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