Post-NCS performance of the hst NICMOS

A. B. Schultz, M. L. Sosey, L. M. Mazzuca, H. A. Bushouse, M. Dickinson, T. Böker, D. Calzetti, S. Arribas, L. E. Bergeron, W. Freudling, S. T. Holfeltz, S. Malhotra, B. Mobasher, K. Noll, E. W. Roye, C. Xu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

We describe the on-orbit performance of the Near Infrared Camera and Multi-Object Spectrometer (NICMOS) aboard the Hubble Space Telescope (HST) following the installation of the NICMOS Cooling System (NCS). NICMOS is operated at a higher temperature (∼77 K) than in the previous observing 1997-1998 period (∼62 K). Due to the higher operating temperature, the detector QE is higher, while the well depth is less. The spatial structure of the flat field response remained essentially unchanged. We will show the effects of operating at the higher temperature and present current NICMOS calibration images. In addition, we present an overview of on-orbit testing and report on the re-enabling of NICMOS.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsJ.C. Mather
Pages858-866
Number of pages9
Volume4850
Edition2
DOIs
StatePublished - 2002
Externally publishedYes
EventIR Space Telescopes and Instruments - waikoloa, HI, United States
Duration: Aug 24 2002Aug 28 2002

Other

OtherIR Space Telescopes and Instruments
CountryUnited States
Citywaikoloa, HI
Period8/24/028/28/02

Keywords

  • HgCdTe
  • Hubble Space Telescope
  • Near-IR detectors
  • NICMOS

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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  • Cite this

    Schultz, A. B., Sosey, M. L., Mazzuca, L. M., Bushouse, H. A., Dickinson, M., Böker, T., Calzetti, D., Arribas, S., Bergeron, L. E., Freudling, W., Holfeltz, S. T., Malhotra, S., Mobasher, B., Noll, K., Roye, E. W., & Xu, C. (2002). Post-NCS performance of the hst NICMOS. In J. C. Mather (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (2 ed., Vol. 4850, pp. 858-866) https://doi.org/10.1117/12.461243