Post-irradiation annealing mechanisms of defects generated in hydrogenated bipolar oxides

X. Jie Chen, Hugh Barnaby, Bert Vermeire, Keith Holbert, David Wright, Ronald L. Pease, Ronald D. Schrimpf, Daniel M. Fleetwood, Sokrates T. Pantelides, Marty R. Shaneyfelt, Philippe Adell

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