Abstract
A simple method for spreading polystyrene-latex spheres onto mica substrates to form highly crystalline layers is described. These layers can be used as a simple calibration standard for the atomic force microscope in the nanometer to micron size range. In particular, they provide simultaneous x, y, and z calibration. The concentration of particles of about 0.01% is found to be good for forming ordered structures. Two-dimensional polycrystalline structures of polytstyrene spheres with different packing orders (cubic and hexagonal close-pack) and some defects (vacancies, dislocations, and grain boundaries) were observed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2630-2633 |
| Number of pages | 4 |
| Journal | Review of Scientific Instruments |
| Volume | 62 |
| Issue number | 11 |
| DOIs | |
| State | Published - 1991 |
ASJC Scopus subject areas
- Instrumentation