Polystyrene latex particles as a size calibration for the atomic force microscope

Research output: Contribution to journalArticle

68 Citations (Scopus)

Abstract

A simple method for spreading polystyrene-latex spheres onto mica substrates to form highly crystalline layers is described. These layers can be used as a simple calibration standard for the atomic force microscope in the nanometer to micron size range. In particular, they provide simultaneous x, y, and z calibration. The concentration of particles of about 0.01% is found to be good for forming ordered structures. Two-dimensional polycrystalline structures of polytstyrene spheres with different packing orders (cubic and hexagonal close-pack) and some defects (vacancies, dislocations, and grain boundaries) were observed.

Original languageEnglish (US)
Pages (from-to)2630-2633
Number of pages4
JournalReview of Scientific Instruments
Volume62
Issue number11
DOIs
StatePublished - 1991

Fingerprint

latex
Latexes
Particles (particulate matter)
Polystyrenes
polystyrene
Microscopes
microscopes
Calibration
Mica
mica
Dislocations (crystals)
Vacancies
Grain boundaries
grain boundaries
Crystalline materials
Defects
defects
Substrates

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Polystyrene latex particles as a size calibration for the atomic force microscope. / Li, Y.; Lindsay, Stuart.

In: Review of Scientific Instruments, Vol. 62, No. 11, 1991, p. 2630-2633.

Research output: Contribution to journalArticle

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