Polystyrene latex particles as a size calibration for the atomic force microscope

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Abstract

A simple method for spreading polystyrene-latex spheres onto mica substrates to form highly crystalline layers is described. These layers can be used as a simple calibration standard for the atomic force microscope in the nanometer to micron size range. In particular, they provide simultaneous x, y, and z calibration. The concentration of particles of about 0.01% is found to be good for forming ordered structures. Two-dimensional polycrystalline structures of polytstyrene spheres with different packing orders (cubic and hexagonal close-pack) and some defects (vacancies, dislocations, and grain boundaries) were observed.

Original languageEnglish (US)
Pages (from-to)2630-2633
Number of pages4
JournalReview of Scientific Instruments
Volume62
Issue number11
DOIs
StatePublished - Dec 1 1991

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ASJC Scopus subject areas

  • Instrumentation

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