@inproceedings{b8eface2257645e4967aaa37ce487afe,
title = "Point sampling with uniformly distributed lines",
abstract = "In this paper we address the problem of extracting representative point samples from polygonal models. The goal of such a sampling algorithm is to find points that are evenly distributed. We propose star-discrepancy as a measure for sampling quality and propose new sampling methods based on global line distributions. We investigate several line generation algorithms including an efficient hardware-based sampling method. Our method contributes to the area of point-based graphics by extracting points that are more evenly distributed than by sampling with current algorithms.",
author = "J. Rovira and P. Wonka and F. Castro and M. Sbert",
year = "2005",
doi = "10.1109/pbg.2005.194071",
language = "English (US)",
isbn = "3905673207",
series = "Point-Based Graphics, 2005 - Eurographics/IEEE VGTC Symposium Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "109--118",
booktitle = "Point-Based Graphics, 2005 - Eurographics/IEEE VGTC Symposium Proceedings",
note = "Eurographics/IEEE VGTC Symposium on Point-Based Graphics, 2005 ; Conference date: 20-06-2005 Through 21-06-2005",
}