Plasmons in amorphous multilayer films

Peter Rez, X. Weng, N. J. Long, A. K. Petford-Long

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

We show, with use of a field-emission scanning transmission electron microscope, changes in the plasmon region from thin films of silicon in a cobalt matrix. These effects are consistent with the dielectric-response theory developed by Howie.

Original languageEnglish (US)
Pages (from-to)9182-9184
Number of pages3
JournalPhysical Review B
Volume42
Issue number14
DOIs
StatePublished - Jan 1 1990

ASJC Scopus subject areas

  • Condensed Matter Physics

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    Rez, P., Weng, X., Long, N. J., & Petford-Long, A. K. (1990). Plasmons in amorphous multilayer films. Physical Review B, 42(14), 9182-9184. https://doi.org/10.1103/PhysRevB.42.9182