PICOSECOND MECHANICAL RELAXATION DUE TO FAST ION DIFFUSION AND STRUCTURAL RELAXATION IN AgI-RICH GLASSFORMING SYSTEMS.

L. Boerjesson, S. Martin, L. M. Torell, C. A. Angell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Relaxation studies at GHz frequencies using Brillouin scattering demonstrate interactions between the diffusive motions of Ag** plus and high frequency phonons in the fast ion conducting glass (AgI)//0//. //6(Ag//2O plus 2B//2O//3)//0//. //4. For the superionic (AgI)//x(AgPO//3)//1// minus //x glasses, the fast ion diffusion relaxation mode was observed in the liquid state where it is resolved from the structural relaxation for concentrations x greater than 0. 3. The relaxation strength of the fast ion diffusion mode is smaller than that of structural relaxation. The data are consistent with single relaxation time behaviour.

Original languageEnglish (US)
Title of host publicationProceedings of the Riso International Symposium on Metallurgy and Materials Science
PublisherRiso Natl Lab
Pages383-388
Number of pages6
ISBN (Print)8755011373
StatePublished - Dec 1 1985
Externally publishedYes

Publication series

NameProceedings of the Riso International Symposium on Metallurgy and Materials Science
ISSN (Print)0108-8599

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'PICOSECOND MECHANICAL RELAXATION DUE TO FAST ION DIFFUSION AND STRUCTURAL RELAXATION IN AgI-RICH GLASSFORMING SYSTEMS.'. Together they form a unique fingerprint.

Cite this