Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors

J. Hubmayr; J. Beall; D. Becker; H. M. Cho; M. Devlin; B. Dober; Christopher Groppi; G. C. Hilton; K. D. Irwin; D. Li; Philip Mauskopf; D. P. Pappas; J. Van Lanen; M. R. Vissers; Y. Wang; L. F. Wei; J. Gao

doi:10.1063/1.4913418

Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors

J. Hubmayr, J. Beall, D. Becker, H. M. Cho, M. Devlin, B. Dober, Christopher Groppi, G. C. Hilton, K. D. Irwin, D. Li, Philip Mauskopf, D. P. Pappas, J. Van Lanen, M. R. Vissers, Y. Wang, L. F. Wei, J. Gao

Research output: Contribution to journal › Article › peer-review

60 Scopus citations

Abstract

We demonstrate photon-noise limited performance at sub-millimeter wavelengths in feedhorn-coupled, microwave kinetic inductance detectors made of a TiN/Ti/TiN trilayer superconducting film, tuned to have a transition temperature of 1.4 K. Micro-machining of the silicon-on-insulator wafer backside creates a quarter-wavelength backshort optimized for efficient coupling at 250 μm. Using frequency read out and when viewing a variable temperature blackbody source, we measure device noise consistent with photon noise when the incident optical power is >0.5 pW, corresponding to noise equivalent powers >3 × 10^-17W/√Hz. This sensitivity makes these devices suitable for broadband photometric applications at these wavelengths.

Original language	English (US)
Article number	073505
Journal	Applied Physics Letters
Volume	106
Issue number	7
DOIs	https://doi.org/10.1063/1.4913418
State	Published - Feb 16 2015

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.4913418

Cite this

Hubmayr, J., Beall, J., Becker, D., Cho, H. M., Devlin, M., Dober, B., Groppi, C., Hilton, G. C., Irwin, K. D., Li, D., Mauskopf, P., Pappas, D. P., Van Lanen, J., Vissers, M. R., Wang, Y., Wei, L. F., & Gao, J. (2015). Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors. Applied Physics Letters, 106(7), Article 073505. https://doi.org/10.1063/1.4913418

@article{111562039e2c4517b5fbc5435d9a9f86,

title = "Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors",

abstract = "We demonstrate photon-noise limited performance at sub-millimeter wavelengths in feedhorn-coupled, microwave kinetic inductance detectors made of a TiN/Ti/TiN trilayer superconducting film, tuned to have a transition temperature of 1.4 K. Micro-machining of the silicon-on-insulator wafer backside creates a quarter-wavelength backshort optimized for efficient coupling at 250 μm. Using frequency read out and when viewing a variable temperature blackbody source, we measure device noise consistent with photon noise when the incident optical power is >0.5 pW, corresponding to noise equivalent powers >3 × 10-17W/√Hz. This sensitivity makes these devices suitable for broadband photometric applications at these wavelengths.",

author = "J. Hubmayr and J. Beall and D. Becker and Cho, {H. M.} and M. Devlin and B. Dober and Christopher Groppi and Hilton, {G. C.} and Irwin, {K. D.} and D. Li and Philip Mauskopf and Pappas, {D. P.} and {Van Lanen}, J. and Vissers, {M. R.} and Y. Wang and Wei, {L. F.} and J. Gao",

note = "Publisher Copyright: {\textcopyright} 2015 AIP Publishing LLC.",

year = "2015",

month = feb,

day = "16",

doi = "10.1063/1.4913418",

language = "English (US)",

volume = "106",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "7",

}

TY - JOUR

T1 - Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors

AU - Hubmayr, J.

AU - Beall, J.

AU - Becker, D.

AU - Cho, H. M.

AU - Devlin, M.

AU - Dober, B.

AU - Groppi, Christopher

AU - Hilton, G. C.

AU - Irwin, K. D.

AU - Li, D.

AU - Mauskopf, Philip

AU - Pappas, D. P.

AU - Van Lanen, J.

AU - Vissers, M. R.

AU - Wang, Y.

AU - Wei, L. F.

AU - Gao, J.

PY - 2015/2/16

Y1 - 2015/2/16

N2 - We demonstrate photon-noise limited performance at sub-millimeter wavelengths in feedhorn-coupled, microwave kinetic inductance detectors made of a TiN/Ti/TiN trilayer superconducting film, tuned to have a transition temperature of 1.4 K. Micro-machining of the silicon-on-insulator wafer backside creates a quarter-wavelength backshort optimized for efficient coupling at 250 μm. Using frequency read out and when viewing a variable temperature blackbody source, we measure device noise consistent with photon noise when the incident optical power is >0.5 pW, corresponding to noise equivalent powers >3 × 10-17W/√Hz. This sensitivity makes these devices suitable for broadband photometric applications at these wavelengths.

AB - We demonstrate photon-noise limited performance at sub-millimeter wavelengths in feedhorn-coupled, microwave kinetic inductance detectors made of a TiN/Ti/TiN trilayer superconducting film, tuned to have a transition temperature of 1.4 K. Micro-machining of the silicon-on-insulator wafer backside creates a quarter-wavelength backshort optimized for efficient coupling at 250 μm. Using frequency read out and when viewing a variable temperature blackbody source, we measure device noise consistent with photon noise when the incident optical power is >0.5 pW, corresponding to noise equivalent powers >3 × 10-17W/√Hz. This sensitivity makes these devices suitable for broadband photometric applications at these wavelengths.

UR - http://www.scopus.com/inward/record.url?scp=84923297814&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84923297814&partnerID=8YFLogxK

U2 - 10.1063/1.4913418

DO - 10.1063/1.4913418

M3 - Article

AN - SCOPUS:84923297814

SN - 0003-6951

VL - 106

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 7

M1 - 073505

ER -

Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this