Abstract
The integrated photogrammetric mapping system flown on the last three Apollo lunar missions (15, 16, and 17) in the early 1970s incorporated a Metric (mapping) Camera, a high-resolution Panoramic Camera, and a star camera and laser altimeter to provide support data. In an ongoing collaboration, the U.S. Geological Survey's Astrogeology Science Center, the Intelligent Robotics Group of the NASA Ames Research Center, and Arizona State University are working to achieve the most complete cartographic development of Apollo mapping system data into versatile digital map products. These will enable a variety of scientific/engineering uses of the data including mission planning, geologic mapping, geophysical process modelling, slope dependent correction of spectral data, and change detection. Here we describe efforts to control the oblique images acquired from the Apollo 15 Metric Camera.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 375-381 |
| Number of pages | 7 |
| Journal | Unknown Journal |
| Volume | 41 |
| DOIs | |
| State | Published - 2016 |
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Keywords
- Apollo 15
- Extra-terrestrial
- Mapping
- Metric camera
- Oblique
- Photogrammetry
ASJC Scopus subject areas
- Information Systems
- Geography, Planning and Development
Cite this
Photogrammetric processing of apollo 15 metric camera oblique images. / Edmundson, K. L.; Alexandrov, O.; Archinal, B. A.; Becker, K. J.; Becker, T. L.; Kirk, R. L.; Moratto, Z. M.; Nefian, A. V.; Richie, J. O.; Robinson, Mark.
In: Unknown Journal, Vol. 41, 2016, p. 375-381.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Photogrammetric processing of apollo 15 metric camera oblique images
AU - Edmundson, K. L.
AU - Alexandrov, O.
AU - Archinal, B. A.
AU - Becker, K. J.
AU - Becker, T. L.
AU - Kirk, R. L.
AU - Moratto, Z. M.
AU - Nefian, A. V.
AU - Richie, J. O.
AU - Robinson, Mark
PY - 2016
Y1 - 2016
N2 - The integrated photogrammetric mapping system flown on the last three Apollo lunar missions (15, 16, and 17) in the early 1970s incorporated a Metric (mapping) Camera, a high-resolution Panoramic Camera, and a star camera and laser altimeter to provide support data. In an ongoing collaboration, the U.S. Geological Survey's Astrogeology Science Center, the Intelligent Robotics Group of the NASA Ames Research Center, and Arizona State University are working to achieve the most complete cartographic development of Apollo mapping system data into versatile digital map products. These will enable a variety of scientific/engineering uses of the data including mission planning, geologic mapping, geophysical process modelling, slope dependent correction of spectral data, and change detection. Here we describe efforts to control the oblique images acquired from the Apollo 15 Metric Camera.
AB - The integrated photogrammetric mapping system flown on the last three Apollo lunar missions (15, 16, and 17) in the early 1970s incorporated a Metric (mapping) Camera, a high-resolution Panoramic Camera, and a star camera and laser altimeter to provide support data. In an ongoing collaboration, the U.S. Geological Survey's Astrogeology Science Center, the Intelligent Robotics Group of the NASA Ames Research Center, and Arizona State University are working to achieve the most complete cartographic development of Apollo mapping system data into versatile digital map products. These will enable a variety of scientific/engineering uses of the data including mission planning, geologic mapping, geophysical process modelling, slope dependent correction of spectral data, and change detection. Here we describe efforts to control the oblique images acquired from the Apollo 15 Metric Camera.
KW - Apollo 15
KW - Extra-terrestrial
KW - Mapping
KW - Metric camera
KW - Oblique
KW - Photogrammetry
UR - http://www.scopus.com/inward/record.url?scp=84978105270&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84978105270&partnerID=8YFLogxK
U2 - 10.5194/isprsarchives-XLI-B4-375-2016
DO - 10.5194/isprsarchives-XLI-B4-375-2016
M3 - Article
AN - SCOPUS:84978105270
VL - 41
SP - 375
EP - 381
JO - Scanning Electron Microscopy
JF - Scanning Electron Microscopy
SN - 0586-5581
ER -