Abstract
Carrier dynamics in aligned InAs/GaAs quantum dots (QDs) grown on cross-hatched patterns induced by metastable InxGa1-xAs layers have been studied by time-resolved photoluminescence. The low-temperature carrier lifetimes were found to be of the order of 100-200 ps and determined by carrier trapping and nonradiative recombination. Comparisons with control "nonaligned" InAs QDs show remarkable differences in dependence of peak PL intensities on excitation power, and in PL decay times dependences on both temperature and excitation intensities. Possible origin of traps, which determine the carrier lifetimes, is discussed.
Original language | English (US) |
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Pages (from-to) | 541-546 |
Number of pages | 6 |
Journal | Physica E: Low-Dimensional Systems and Nanostructures |
Volume | 18 |
Issue number | 4 |
DOIs | |
State | Published - Jun 2003 |
Keywords
- Dislocations
- Lateral alignment
- Quantum dots
- Time-resolved photoluminescence
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics