TY - JOUR
T1 - Photocathode behavior during high current running in the Cornell energy recovery linac photoinjector
AU - Cultrera, Luca
AU - Maxson, Jared
AU - Bazarov, Ivan
AU - Belomestnykh, Sergey
AU - Dobbins, John
AU - Dunham, Bruce
AU - Karkare, Siddharth
AU - Kaplan, Roger
AU - Kostroun, Vaclav
AU - Li, Yulin
AU - Liu, Xianghong
AU - Löhl, Florian
AU - Smolenski, Karl
AU - Zhao, Zhi
AU - Rice, David
AU - Quigley, Peter
AU - Tigner, Maury
AU - Veshcherevich, Vadim
AU - Finkelstein, Kenneth
AU - Dale, Darren
AU - Pichler, Benjamin
PY - 2011/12/8
Y1 - 2011/12/8
N2 - The Cornell University energy recovery linac (ERL) photoinjector has recently demonstrated operation at 20 mA for approximately 8 hours, utilizing a multialkali photocathode deposited on a Si substrate. We describe the recipe for photocathode deposition, and will detail the parameters of the run. Post-run analysis of the photocathode indicates the presence of significant damage to the substrate, perhaps due to ion back-bombardment from the residual beam line gas. While the exact cause of the substrate damage remains unknown, we describe multiple surface characterization techniques (x-ray fluorescence spectroscopy, x-ray diffraction, atomic force, and scanning electron microscopy) used to study the interesting morphological and crystallographic features of the photocathode surface after its use for high current beam production. Finally, we present a simple model of crystal damage due to ion back-bombardment, which agrees qualitatively with the distribution of damage on the substrate surface.
AB - The Cornell University energy recovery linac (ERL) photoinjector has recently demonstrated operation at 20 mA for approximately 8 hours, utilizing a multialkali photocathode deposited on a Si substrate. We describe the recipe for photocathode deposition, and will detail the parameters of the run. Post-run analysis of the photocathode indicates the presence of significant damage to the substrate, perhaps due to ion back-bombardment from the residual beam line gas. While the exact cause of the substrate damage remains unknown, we describe multiple surface characterization techniques (x-ray fluorescence spectroscopy, x-ray diffraction, atomic force, and scanning electron microscopy) used to study the interesting morphological and crystallographic features of the photocathode surface after its use for high current beam production. Finally, we present a simple model of crystal damage due to ion back-bombardment, which agrees qualitatively with the distribution of damage on the substrate surface.
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U2 - 10.1103/PhysRevSTAB.14.120101
DO - 10.1103/PhysRevSTAB.14.120101
M3 - Article
AN - SCOPUS:84555218329
SN - 1098-4402
VL - 14
JO - Physical Review Special Topics - Accelerators and Beams
JF - Physical Review Special Topics - Accelerators and Beams
IS - 12
M1 - 120101
ER -