Photo-emission electron microscopy (PEEM) of cleaned and etched 6H-SiC(0001)

J. D. Hartman, K. Naniwae, C. Petrich, V. Ramachandran, R. M. Feenstra, Robert Nemanich, R. F. Davis

Research output: Chapter in Book/Report/Conference proceedingChapter

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Engineering & Materials Science

Chemical Compounds