Phase transformations during microcutting tests on silicon

B. V. Tanikella, A. H. Somasekhar, A. T. Sowers, Robert Nemanich, R. O. Scattergood

Research output: Contribution to journalArticle

59 Citations (Scopus)

Abstract

Controlled slow-speed microcutting tests were made on single crystal silicon. Micro-Raman spectroscopy confirmed the presence of amorphous silicon within the microcutting grooves as well as in the debris particles removed from the grooves. These results indicate that pressure-induced transformation to metallic silicon can occur during microcutting and the ductile metallic phase will facilitate the cutting process. Raman spectroscopy further indicated the presence of large residual tensile strains in some areas of the microcutting grooves.

Original languageEnglish (US)
Pages (from-to)2870-2872
Number of pages3
JournalApplied Physics Letters
Volume69
Issue number19
StatePublished - Nov 4 1996
Externally publishedYes

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grooves
phase transformations
silicon
Raman spectroscopy
debris
amorphous silicon
single crystals

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Tanikella, B. V., Somasekhar, A. H., Sowers, A. T., Nemanich, R., & Scattergood, R. O. (1996). Phase transformations during microcutting tests on silicon. Applied Physics Letters, 69(19), 2870-2872.

Phase transformations during microcutting tests on silicon. / Tanikella, B. V.; Somasekhar, A. H.; Sowers, A. T.; Nemanich, Robert; Scattergood, R. O.

In: Applied Physics Letters, Vol. 69, No. 19, 04.11.1996, p. 2870-2872.

Research output: Contribution to journalArticle

Tanikella, BV, Somasekhar, AH, Sowers, AT, Nemanich, R & Scattergood, RO 1996, 'Phase transformations during microcutting tests on silicon', Applied Physics Letters, vol. 69, no. 19, pp. 2870-2872.
Tanikella BV, Somasekhar AH, Sowers AT, Nemanich R, Scattergood RO. Phase transformations during microcutting tests on silicon. Applied Physics Letters. 1996 Nov 4;69(19):2870-2872.
Tanikella, B. V. ; Somasekhar, A. H. ; Sowers, A. T. ; Nemanich, Robert ; Scattergood, R. O. / Phase transformations during microcutting tests on silicon. In: Applied Physics Letters. 1996 ; Vol. 69, No. 19. pp. 2870-2872.
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