Abstract

Phase-shifting electron holography was used to reconstruct the object-wave function of high-spatial-frequency specimens of HgCdTe, and the requirements for precise measurements were investigated. Fresnel fringes due to the electrostatic biprism caused serious calculation errors during the phase-shifting reconstruction. Uniform interference fringes, obtained by adjusting the biprism voltage to cancel out the Fresnel fringes, were needed to minimize these errors. High-resolution holograms of a HgCdTe single crystal were recorded with coarse interference fringes and a high visibility of 65% and then used to reconstruct the atomic-scale object wave. Although the spatial resolution (0.25 nm) of the transmission electron microscope was worse than the separation (0.16 nm) between Hg (or Cd) and Te columns, the crystal polarity was determined from the aberration-corrected object wave.

Original languageEnglish (US)
JournalJournal of Electron Microscopy
Volume59
Issue numberSUPPL. 1
DOIs
StatePublished - Aug 2010

Fingerprint

Holography
Electron holography
Computer-Assisted Image Processing
image reconstruction
Image reconstruction
holography
Electrons
interference
Holograms
Wave functions
Aberrations
Static Electricity
visibility
Visibility
aberration
Electrostatics
polarity
electrons
Electron microscopes
electron microscopes

Keywords

  • Fresnel fringes
  • high-resolution electron microscopy
  • phase-shifting electron holography

ASJC Scopus subject areas

  • Instrumentation

Cite this

Phase-shifting electron holography for atomic image reconstruction. / Yamamoto, Kazuo; Sugawara, Yoshihiro; McCartney, Martha; Smith, David.

In: Journal of Electron Microscopy, Vol. 59, No. SUPPL. 1, 08.2010.

Research output: Contribution to journalArticle

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