Phase-shifting electron holography for atomic image reconstruction

Kazuo Yamamoto; Yoshihiro Sugawara; Martha McCartney; David Smith

doi:10.1093/jmicro/dfq033

Phase-shifting electron holography for atomic image reconstruction

Kazuo Yamamoto, Yoshihiro Sugawara, Martha McCartney, David Smith

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Phase-shifting electron holography was used to reconstruct the object-wave function of high-spatial-frequency specimens of HgCdTe, and the requirements for precise measurements were investigated. Fresnel fringes due to the electrostatic biprism caused serious calculation errors during the phase-shifting reconstruction. Uniform interference fringes, obtained by adjusting the biprism voltage to cancel out the Fresnel fringes, were needed to minimize these errors. High-resolution holograms of a HgCdTe single crystal were recorded with coarse interference fringes and a high visibility of 65% and then used to reconstruct the atomic-scale object wave. Although the spatial resolution (0.25 nm) of the transmission electron microscope was worse than the separation (0.16 nm) between Hg (or Cd) and Te columns, the crystal polarity was determined from the aberration-corrected object wave.

Original language	English (US)
Pages (from-to)	S81-S88
Journal	Journal of Electron Microscopy
Volume	59
Issue number	SUPPL. 1
DOIs	https://doi.org/10.1093/jmicro/dfq033
State	Published - Aug 2010

Keywords

Fresnel fringes
high-resolution electron microscopy
phase-shifting electron holography

ASJC Scopus subject areas

Instrumentation

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10.1093/jmicro/dfq033

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@article{3de73ef620874a278f6ccbb72e7042a2,

title = "Phase-shifting electron holography for atomic image reconstruction",

abstract = "Phase-shifting electron holography was used to reconstruct the object-wave function of high-spatial-frequency specimens of HgCdTe, and the requirements for precise measurements were investigated. Fresnel fringes due to the electrostatic biprism caused serious calculation errors during the phase-shifting reconstruction. Uniform interference fringes, obtained by adjusting the biprism voltage to cancel out the Fresnel fringes, were needed to minimize these errors. High-resolution holograms of a HgCdTe single crystal were recorded with coarse interference fringes and a high visibility of 65% and then used to reconstruct the atomic-scale object wave. Although the spatial resolution (0.25 nm) of the transmission electron microscope was worse than the separation (0.16 nm) between Hg (or Cd) and Te columns, the crystal polarity was determined from the aberration-corrected object wave.",

keywords = "Fresnel fringes, high-resolution electron microscopy, phase-shifting electron holography",

author = "Kazuo Yamamoto and Yoshihiro Sugawara and Martha McCartney and David Smith",

note = "Funding Information: This work was supported by the Research Fellowship of Japan Society for the Promotion of Science for Young Scientists. We are grateful to Professor Takayoshi Tanji for his valuable comments about aberration correction using electron holography. We also thank Dr Changzhen Wang for providing the HgCdTe TEM sample. We gratefully acknowledge the use of facilities within the John M. Cowley Center for High-Resolution Electron Microscopy at Arizona State University. Copyright: Copyright 2010 Elsevier B.V., All rights reserved.",

year = "2010",

month = aug,

doi = "10.1093/jmicro/dfq033",

language = "English (US)",

volume = "59",

pages = "S81--S88",

journal = "Journal of Electron Microscopy",

issn = "0022-0744",

publisher = "Japanese Society of Microscopy",

number = "SUPPL. 1",

}

TY - JOUR

T1 - Phase-shifting electron holography for atomic image reconstruction

AU - Yamamoto, Kazuo

AU - Sugawara, Yoshihiro

AU - McCartney, Martha

AU - Smith, David

N1 - Funding Information: This work was supported by the Research Fellowship of Japan Society for the Promotion of Science for Young Scientists. We are grateful to Professor Takayoshi Tanji for his valuable comments about aberration correction using electron holography. We also thank Dr Changzhen Wang for providing the HgCdTe TEM sample. We gratefully acknowledge the use of facilities within the John M. Cowley Center for High-Resolution Electron Microscopy at Arizona State University. Copyright: Copyright 2010 Elsevier B.V., All rights reserved.

PY - 2010/8

Y1 - 2010/8

N2 - Phase-shifting electron holography was used to reconstruct the object-wave function of high-spatial-frequency specimens of HgCdTe, and the requirements for precise measurements were investigated. Fresnel fringes due to the electrostatic biprism caused serious calculation errors during the phase-shifting reconstruction. Uniform interference fringes, obtained by adjusting the biprism voltage to cancel out the Fresnel fringes, were needed to minimize these errors. High-resolution holograms of a HgCdTe single crystal were recorded with coarse interference fringes and a high visibility of 65% and then used to reconstruct the atomic-scale object wave. Although the spatial resolution (0.25 nm) of the transmission electron microscope was worse than the separation (0.16 nm) between Hg (or Cd) and Te columns, the crystal polarity was determined from the aberration-corrected object wave.

AB - Phase-shifting electron holography was used to reconstruct the object-wave function of high-spatial-frequency specimens of HgCdTe, and the requirements for precise measurements were investigated. Fresnel fringes due to the electrostatic biprism caused serious calculation errors during the phase-shifting reconstruction. Uniform interference fringes, obtained by adjusting the biprism voltage to cancel out the Fresnel fringes, were needed to minimize these errors. High-resolution holograms of a HgCdTe single crystal were recorded with coarse interference fringes and a high visibility of 65% and then used to reconstruct the atomic-scale object wave. Although the spatial resolution (0.25 nm) of the transmission electron microscope was worse than the separation (0.16 nm) between Hg (or Cd) and Te columns, the crystal polarity was determined from the aberration-corrected object wave.

KW - Fresnel fringes

KW - high-resolution electron microscopy

KW - phase-shifting electron holography

UR - http://www.scopus.com/inward/record.url?scp=77955546997&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77955546997&partnerID=8YFLogxK

U2 - 10.1093/jmicro/dfq033

DO - 10.1093/jmicro/dfq033

M3 - Article

C2 - 20543160

AN - SCOPUS:77955546997

SN - 0022-0744

VL - 59

SP - S81-S88

JO - Journal of Electron Microscopy

JF - Journal of Electron Microscopy

IS - SUPPL. 1

ER -

Phase-shifting electron holography for atomic image reconstruction

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Keywords

ASJC Scopus subject areas

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