Phase retrieval from crystalline diffraction averaged over several different unit cells

Joe P.J. Chen, Rick A. Kirian, Kenneth R. Beyerlein, Richard J. Bean, Henry N. Chapman, Philip J. Bones, Rick P. Millane

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In protein nanocrystallography using x-ray lasers, diffraction is measured from an ensemble of very small crystals. The measured diffraction data can sometimes be processed to estimate the continuous Fourier transform intensity of the contents within the unit cell that makes up the crystals. However, in most cases the intensity data are averaged over a number of different kinds of unit cell that can occur in the ensemble. We investigate the properties of this problem and describe two algorithms to reconstruct the electron density of these unit cells from the averaged x-ray diffraction intensity data. The algorithms are evaluated by simulation.

Original languageEnglish (US)
Title of host publicationProceedings of IVCNZ 2014
Subtitle of host publicationThe 29th International Conference on Image and Vision Computing New Zealand
PublisherAssociation for Computing Machinery
Pages202-206
Number of pages5
ISBN (Electronic)9781450331845
DOIs
StatePublished - Nov 19 2014
Externally publishedYes
Event29th International Conference on Image and Vision Computing New Zealand, IVCNZ 2014 - Hamilton, New Zealand
Duration: Nov 19 2014Nov 21 2014

Publication series

NameACM International Conference Proceeding Series
Volume19-21-November-2014

Other

Other29th International Conference on Image and Vision Computing New Zealand, IVCNZ 2014
Country/TerritoryNew Zealand
CityHamilton
Period11/19/1411/21/14

Keywords

  • Crystallography
  • Image reconstruction
  • Iterative search algorithms
  • Nanocrystals
  • Phase retrieval
  • Symmetry
  • X-ray free-electron lasers

ASJC Scopus subject areas

  • Software
  • Human-Computer Interaction
  • Computer Vision and Pattern Recognition
  • Computer Networks and Communications

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