PHASE DETERMINATION OF MULTIPLY SCATTERED BEAMS IN STEM.

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Abstract

A method is described in which principle allows the phase differences between multiply scattered electron beams to be determined. The method uses coherent overlapping diffracted orders in STEM. Experimental requirements for the application of the method are outlined.

Original languageEnglish (US)
Pages (from-to)117-120
Number of pages4
JournalOptik (Jena)
Volume49
Issue number1
StatePublished - Jan 1 1977
Externally publishedYes

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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