Abstract
A method is described in which principle allows the phase differences between multiply scattered electron beams to be determined. The method uses coherent overlapping diffracted orders in STEM. Experimental requirements for the application of the method are outlined.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 117-120 |
| Number of pages | 4 |
| Journal | Optik (Jena) |
| Volume | 49 |
| Issue number | 1 |
| State | Published - Jan 1 1977 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering