PHASE DETERMINATION OF MULTIPLY SCATTERED BEAMS IN STEM.

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

A method is described in which principle allows the phase differences between multiply scattered electron beams to be determined. The method uses coherent overlapping diffracted orders in STEM. Experimental requirements for the application of the method are outlined.

Original languageEnglish (US)
Pages (from-to)117-120
Number of pages4
JournalOptik (Jena)
Volume49
Issue number1
StatePublished - Oct 1977
Externally publishedYes

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stems
Electron beams
electron beams
requirements

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

PHASE DETERMINATION OF MULTIPLY SCATTERED BEAMS IN STEM. / Spence, John.

In: Optik (Jena), Vol. 49, No. 1, 10.1977, p. 117-120.

Research output: Contribution to journalArticle

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