Performance test of amorphous silicon modules in different climates - Year four: Progress in understanding exposure history stabilization effects

R. Ruther, J. Del Cueto, Govindasamy Tamizhmani, A. A. Montenegro, S. Rummel, A. Anderberg, B. Von Roedern

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    25 Citations (Scopus)

    Abstract

    In a round robin outdoor exposure experiment carried out in three different climates, we have previously demonstrated that amorphous silicon (a-Si) PV modules reach higher stabilized performance levels in warmer climates. The four-year experiment involved three identical sets of thin-film a-Si modules from various manufacturers deployed outdoors simultaneously in three sites with distinct climates. Each PV module set spent a one-year period at each site before a final period at the original site where it was first deployed. The experiment aimed to determine the light-induced degradation and stabilization characteristics of a-Si regarding specific history of exposure, and to compare degradation rates in different climates. We propose that after the initial sharp degradation associated with the Stabler-Wronski effect (SWE) has passed, the subsequent stabilized performance levels attained will depend largely on light exposure and a characteristic temperature associated within a coherent time-scale. PV modules which were first deployed at the lowest-temperature site for one year, reaching a stabilized state, and were then further deployed at higher temperature sites for two more years, experienced considerable recovery in output parameters (Pmax and FF). However, when further deployed back at the original, lowest-temperature site, performance degraded back to the first year, original level.

    Original languageEnglish (US)
    Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
    DOIs
    StatePublished - 2008
    Event33rd IEEE Photovoltaic Specialists Conference, PVSC 2008 - San Diego, CA, United States
    Duration: May 11 2008May 16 2008

    Other

    Other33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
    CountryUnited States
    CitySan Diego, CA
    Period5/11/085/16/08

    Fingerprint

    Amorphous silicon
    Stabilization
    Degradation
    Temperature
    Experiments
    Recovery
    Thin films

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering

    Cite this

    Ruther, R., Del Cueto, J., Tamizhmani, G., Montenegro, A. A., Rummel, S., Anderberg, A., & Von Roedern, B. (2008). Performance test of amorphous silicon modules in different climates - Year four: Progress in understanding exposure history stabilization effects. In Conference Record of the IEEE Photovoltaic Specialists Conference [4922773] https://doi.org/10.1109/PVSC.2008.4922773

    Performance test of amorphous silicon modules in different climates - Year four : Progress in understanding exposure history stabilization effects. / Ruther, R.; Del Cueto, J.; Tamizhmani, Govindasamy; Montenegro, A. A.; Rummel, S.; Anderberg, A.; Von Roedern, B.

    Conference Record of the IEEE Photovoltaic Specialists Conference. 2008. 4922773.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Ruther, R, Del Cueto, J, Tamizhmani, G, Montenegro, AA, Rummel, S, Anderberg, A & Von Roedern, B 2008, Performance test of amorphous silicon modules in different climates - Year four: Progress in understanding exposure history stabilization effects. in Conference Record of the IEEE Photovoltaic Specialists Conference., 4922773, 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008, San Diego, CA, United States, 5/11/08. https://doi.org/10.1109/PVSC.2008.4922773
    Ruther R, Del Cueto J, Tamizhmani G, Montenegro AA, Rummel S, Anderberg A et al. Performance test of amorphous silicon modules in different climates - Year four: Progress in understanding exposure history stabilization effects. In Conference Record of the IEEE Photovoltaic Specialists Conference. 2008. 4922773 https://doi.org/10.1109/PVSC.2008.4922773
    Ruther, R. ; Del Cueto, J. ; Tamizhmani, Govindasamy ; Montenegro, A. A. ; Rummel, S. ; Anderberg, A. ; Von Roedern, B. / Performance test of amorphous silicon modules in different climates - Year four : Progress in understanding exposure history stabilization effects. Conference Record of the IEEE Photovoltaic Specialists Conference. 2008.
    @inproceedings{3033492524a6403b8ab222034f2e35a2,
    title = "Performance test of amorphous silicon modules in different climates - Year four: Progress in understanding exposure history stabilization effects",
    abstract = "In a round robin outdoor exposure experiment carried out in three different climates, we have previously demonstrated that amorphous silicon (a-Si) PV modules reach higher stabilized performance levels in warmer climates. The four-year experiment involved three identical sets of thin-film a-Si modules from various manufacturers deployed outdoors simultaneously in three sites with distinct climates. Each PV module set spent a one-year period at each site before a final period at the original site where it was first deployed. The experiment aimed to determine the light-induced degradation and stabilization characteristics of a-Si regarding specific history of exposure, and to compare degradation rates in different climates. We propose that after the initial sharp degradation associated with the Stabler-Wronski effect (SWE) has passed, the subsequent stabilized performance levels attained will depend largely on light exposure and a characteristic temperature associated within a coherent time-scale. PV modules which were first deployed at the lowest-temperature site for one year, reaching a stabilized state, and were then further deployed at higher temperature sites for two more years, experienced considerable recovery in output parameters (Pmax and FF). However, when further deployed back at the original, lowest-temperature site, performance degraded back to the first year, original level.",
    author = "R. Ruther and {Del Cueto}, J. and Govindasamy Tamizhmani and Montenegro, {A. A.} and S. Rummel and A. Anderberg and {Von Roedern}, B.",
    year = "2008",
    doi = "10.1109/PVSC.2008.4922773",
    language = "English (US)",
    isbn = "9781424416417",
    booktitle = "Conference Record of the IEEE Photovoltaic Specialists Conference",

    }

    TY - GEN

    T1 - Performance test of amorphous silicon modules in different climates - Year four

    T2 - Progress in understanding exposure history stabilization effects

    AU - Ruther, R.

    AU - Del Cueto, J.

    AU - Tamizhmani, Govindasamy

    AU - Montenegro, A. A.

    AU - Rummel, S.

    AU - Anderberg, A.

    AU - Von Roedern, B.

    PY - 2008

    Y1 - 2008

    N2 - In a round robin outdoor exposure experiment carried out in three different climates, we have previously demonstrated that amorphous silicon (a-Si) PV modules reach higher stabilized performance levels in warmer climates. The four-year experiment involved three identical sets of thin-film a-Si modules from various manufacturers deployed outdoors simultaneously in three sites with distinct climates. Each PV module set spent a one-year period at each site before a final period at the original site where it was first deployed. The experiment aimed to determine the light-induced degradation and stabilization characteristics of a-Si regarding specific history of exposure, and to compare degradation rates in different climates. We propose that after the initial sharp degradation associated with the Stabler-Wronski effect (SWE) has passed, the subsequent stabilized performance levels attained will depend largely on light exposure and a characteristic temperature associated within a coherent time-scale. PV modules which were first deployed at the lowest-temperature site for one year, reaching a stabilized state, and were then further deployed at higher temperature sites for two more years, experienced considerable recovery in output parameters (Pmax and FF). However, when further deployed back at the original, lowest-temperature site, performance degraded back to the first year, original level.

    AB - In a round robin outdoor exposure experiment carried out in three different climates, we have previously demonstrated that amorphous silicon (a-Si) PV modules reach higher stabilized performance levels in warmer climates. The four-year experiment involved three identical sets of thin-film a-Si modules from various manufacturers deployed outdoors simultaneously in three sites with distinct climates. Each PV module set spent a one-year period at each site before a final period at the original site where it was first deployed. The experiment aimed to determine the light-induced degradation and stabilization characteristics of a-Si regarding specific history of exposure, and to compare degradation rates in different climates. We propose that after the initial sharp degradation associated with the Stabler-Wronski effect (SWE) has passed, the subsequent stabilized performance levels attained will depend largely on light exposure and a characteristic temperature associated within a coherent time-scale. PV modules which were first deployed at the lowest-temperature site for one year, reaching a stabilized state, and were then further deployed at higher temperature sites for two more years, experienced considerable recovery in output parameters (Pmax and FF). However, when further deployed back at the original, lowest-temperature site, performance degraded back to the first year, original level.

    UR - http://www.scopus.com/inward/record.url?scp=84879721335&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=84879721335&partnerID=8YFLogxK

    U2 - 10.1109/PVSC.2008.4922773

    DO - 10.1109/PVSC.2008.4922773

    M3 - Conference contribution

    AN - SCOPUS:84879721335

    SN - 9781424416417

    BT - Conference Record of the IEEE Photovoltaic Specialists Conference

    ER -