Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment

Keith Holbert, A. Sharif Heger, Steven S. McCready

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Prompted by the unexpected failure of piezoresistive sensors in both an elevated gamma-ray environment and reactor core pulse tests, we initiated radiation testing of several MEMS piezoresistive accelerometers and pressure transducers to ascertain their radiation hardness. Some commercial off-the-shelf sensors are found to be viable options for use in a high-energy pulsed reactor, but others suffer severe degradation and even catastrophic failure. Although researchers are promoting the use of MEMS devices in radiation-harsh environment, we nevertheless find assurance testing necessary.

Original languageEnglish (US)
Title of host publication2010 IEEE Radiation Effects Data Workshop, REDW 2010, Proceedings
Pages129-136
Number of pages8
DOIs
StatePublished - 2010
Event2010 IEEE Radiation Effects Data Workshop, REDW 2010 - Denver, CO, United States
Duration: Jul 19 2010Jul 23 2010

Publication series

NameIEEE Radiation Effects Data Workshop

Other

Other2010 IEEE Radiation Effects Data Workshop, REDW 2010
CountryUnited States
CityDenver, CO
Period7/19/107/23/10

Keywords

  • Microelectromechanical devices
  • Nuclear radiation effects
  • Piezoresistive devices
  • Transducers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation
  • Nuclear and High Energy Physics

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    Holbert, K., Heger, A. S., & McCready, S. S. (2010). Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment. In 2010 IEEE Radiation Effects Data Workshop, REDW 2010, Proceedings (pp. 129-136). [5619509] (IEEE Radiation Effects Data Workshop). https://doi.org/10.1109/REDW.2010.5619509