Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment

Keith Holbert; A. Sharif Heger; Steven S. McCready

doi:10.1109/REDW.2010.5619509

Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment

Keith Holbert, A. Sharif Heger, Steven S. McCready

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

Prompted by the unexpected failure of piezoresistive sensors in both an elevated gamma-ray environment and reactor core pulse tests, we initiated radiation testing of several MEMS piezoresistive accelerometers and pressure transducers to ascertain their radiation hardness. Some commercial off-the-shelf sensors are found to be viable options for use in a high-energy pulsed reactor, but others suffer severe degradation and even catastrophic failure. Although researchers are promoting the use of MEMS devices in radiation-harsh environment, we nevertheless find assurance testing necessary.

Original language	English (US)
Title of host publication	2010 IEEE Radiation Effects Data Workshop, REDW 2010, Proceedings
Pages	129-136
Number of pages	8
DOIs	https://doi.org/10.1109/REDW.2010.5619509
State	Published - 2010
Event	2010 IEEE Radiation Effects Data Workshop, REDW 2010 - Denver, CO, United States Duration: Jul 19 2010 → Jul 23 2010

Publication series

Name	IEEE Radiation Effects Data Workshop

Other

Other	2010 IEEE Radiation Effects Data Workshop, REDW 2010
Country/Territory	United States
City	Denver, CO
Period	7/19/10 → 7/23/10

Keywords

Microelectromechanical devices
Nuclear radiation effects
Piezoresistive devices
Transducers

ASJC Scopus subject areas

Electrical and Electronic Engineering
Radiation
Nuclear and High Energy Physics

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10.1109/REDW.2010.5619509

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Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment. / Holbert, Keith; Heger, A. Sharif; McCready, Steven S.
2010 IEEE Radiation Effects Data Workshop, REDW 2010, Proceedings. 2010. p. 129-136 5619509 (IEEE Radiation Effects Data Workshop).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Holbert, K, Heger, AS & McCready, SS 2010, Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment. in 2010 IEEE Radiation Effects Data Workshop, REDW 2010, Proceedings., 5619509, IEEE Radiation Effects Data Workshop, pp. 129-136, 2010 IEEE Radiation Effects Data Workshop, REDW 2010, Denver, CO, United States, 7/19/10. https://doi.org/10.1109/REDW.2010.5619509

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abstract = "Prompted by the unexpected failure of piezoresistive sensors in both an elevated gamma-ray environment and reactor core pulse tests, we initiated radiation testing of several MEMS piezoresistive accelerometers and pressure transducers to ascertain their radiation hardness. Some commercial off-the-shelf sensors are found to be viable options for use in a high-energy pulsed reactor, but others suffer severe degradation and even catastrophic failure. Although researchers are promoting the use of MEMS devices in radiation-harsh environment, we nevertheless find assurance testing necessary.",

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KW - Transducers

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Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

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