Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment

Keith Holbert, A. Sharif Heger, Steven S. McCready

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Prompted by the unexpected failure of piezoresistive sensors in both an elevated gamma-ray environment and reactor core pulse tests, we initiated radiation testing of several MEMS piezoresistive accelerometers and pressure transducers to ascertain their radiation hardness. Some commercial off-the-shelf sensors are found to be viable options for use in a high-energy pulsed reactor, but others suffer severe degradation and even catastrophic failure. Although researchers are promoting the use of MEMS devices in radiation-harsh environment, we nevertheless find assurance testing necessary.

Original languageEnglish (US)
Title of host publicationIEEE Radiation Effects Data Workshop
Pages129-136
Number of pages8
DOIs
StatePublished - 2010
Event2010 IEEE Radiation Effects Data Workshop, REDW 2010 - Denver, CO, United States
Duration: Jul 19 2010Jul 23 2010

Other

Other2010 IEEE Radiation Effects Data Workshop, REDW 2010
CountryUnited States
CityDenver, CO
Period7/19/107/23/10

Fingerprint

shelves
microelectromechanical systems
MEMS
reactors
Radiation
sensors
Sensors
radiation
reactor cores
Reactor cores
Pressure transducers
Testing
assurance
accelerometers
pressure sensors
Accelerometers
Gamma rays
transducers
hardness
Hardness

Keywords

  • Microelectromechanical devices
  • Nuclear radiation effects
  • Piezoresistive devices
  • Transducers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation
  • Nuclear and High Energy Physics

Cite this

Holbert, K., Heger, A. S., & McCready, S. S. (2010). Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment. In IEEE Radiation Effects Data Workshop (pp. 129-136). [5619509] https://doi.org/10.1109/REDW.2010.5619509

Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment. / Holbert, Keith; Heger, A. Sharif; McCready, Steven S.

IEEE Radiation Effects Data Workshop. 2010. p. 129-136 5619509.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Holbert, K, Heger, AS & McCready, SS 2010, Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment. in IEEE Radiation Effects Data Workshop., 5619509, pp. 129-136, 2010 IEEE Radiation Effects Data Workshop, REDW 2010, Denver, CO, United States, 7/19/10. https://doi.org/10.1109/REDW.2010.5619509
Holbert, Keith ; Heger, A. Sharif ; McCready, Steven S. / Performance of commercial off-the-shelf microelectromechanical systems sensors in a pulsed reactor environment. IEEE Radiation Effects Data Workshop. 2010. pp. 129-136
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