Abstract
We compare the performance of two phase II monitoring schemes for linear profiles, one based on the classical calibration method monitoring the deviations from the regression line (referred to as the NIST method) and the second based on individually monitoring the parameters of the linear profile (referred to as the KMW method). The comparison criterion is average run length performance under different sustained shifts in the intercept, slope and error standard deviation of the linear calibration line. A simulation study shows that the NIST method performs poorly compared to the combined control charting scheme of the KMW method.
Original language | English (US) |
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Pages (from-to) | 1927-1942 |
Number of pages | 16 |
Journal | International Journal of Production Research |
Volume | 44 |
Issue number | 10 |
DOIs | |
State | Published - May 15 2006 |
Keywords
- Average run length
- Profile monitoring
- Simple linear regression
- Statistical process control
ASJC Scopus subject areas
- Strategy and Management
- Management Science and Operations Research
- Industrial and Manufacturing Engineering