Per-device adaptive test for analog/RF circuits using entropy-based process monitoring

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

We present an adaptive test flow for mixed-signal circuits that aims at optimizing the test set on a per-device basis so that more test resources can be devoted to marginal devices while passing devices that are not marginal with less testing. Cumulative statistics of the process are monitored using a differential entropy-based approach and updated only when necessary. Thus, process shift is captured and continuously incorporated into the analysis. We also include provisions to identify potentially defective devices and test them more extensively since these devices do not conform to learned collective information. We conduct experiments on an low-noise amplifier circuit in simulations, and apply our techniques to production data of two distinct industrial circuits. Both the simulation results and the results on large-scale production data show that adaptive test provides the best tradeoff between test time and test quality as measured in terms of defective parts per million.

Original languageEnglish (US)
Article number6248732
Pages (from-to)1116-1128
Number of pages13
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume21
Issue number6
DOIs
StatePublished - Jan 1 2013

    Fingerprint

Keywords

  • Adaptive test
  • device level test adaptation
  • growing neural networks
  • nonlinear filtering
  • process monitoring
  • support vector machine (SVM)

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this