Per-device adaptive test for analog/RF circuits using entropy-based process monitoring

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

We present an adaptive test flow for mixed-signal circuits that aims at optimizing the test set on a per-device basis so that more test resources can be devoted to marginal devices while passing devices that are not marginal with less testing. Cumulative statistics of the process are monitored using a differential entropy-based approach and updated only when necessary. Thus, process shift is captured and continuously incorporated into the analysis. We also include provisions to identify potentially defective devices and test them more extensively since these devices do not conform to learned collective information. We conduct experiments on an low-noise amplifier circuit in simulations, and apply our techniques to production data of two distinct industrial circuits. Both the simulation results and the results on large-scale production data show that adaptive test provides the best tradeoff between test time and test quality as measured in terms of defective parts per million.

Original languageEnglish (US)
Article number6248732
Pages (from-to)1116-1128
Number of pages13
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume21
Issue number6
DOIs
StatePublished - 2013

Fingerprint

Process monitoring
Entropy
Networks (circuits)
Low noise amplifiers
Statistics
Testing
Experiments

Keywords

  • Adaptive test
  • device level test adaptation
  • growing neural networks
  • nonlinear filtering
  • process monitoring
  • support vector machine (SVM)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Software

Cite this

Per-device adaptive test for analog/RF circuits using entropy-based process monitoring. / Yilmaz, Ender; Ozev, Sule; Butler, Kenneth M.

In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 21, No. 6, 6248732, 2013, p. 1116-1128.

Research output: Contribution to journalArticle

@article{f07b20154bf546e486e6240fddb16619,
title = "Per-device adaptive test for analog/RF circuits using entropy-based process monitoring",
abstract = "We present an adaptive test flow for mixed-signal circuits that aims at optimizing the test set on a per-device basis so that more test resources can be devoted to marginal devices while passing devices that are not marginal with less testing. Cumulative statistics of the process are monitored using a differential entropy-based approach and updated only when necessary. Thus, process shift is captured and continuously incorporated into the analysis. We also include provisions to identify potentially defective devices and test them more extensively since these devices do not conform to learned collective information. We conduct experiments on an low-noise amplifier circuit in simulations, and apply our techniques to production data of two distinct industrial circuits. Both the simulation results and the results on large-scale production data show that adaptive test provides the best tradeoff between test time and test quality as measured in terms of defective parts per million.",
keywords = "Adaptive test, device level test adaptation, growing neural networks, nonlinear filtering, process monitoring, support vector machine (SVM)",
author = "Ender Yilmaz and Sule Ozev and Butler, {Kenneth M.}",
year = "2013",
doi = "10.1109/TVLSI.2012.2205027",
language = "English (US)",
volume = "21",
pages = "1116--1128",
journal = "IEEE Transactions on Very Large Scale Integration (VLSI) Systems",
issn = "1063-8210",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",

}

TY - JOUR

T1 - Per-device adaptive test for analog/RF circuits using entropy-based process monitoring

AU - Yilmaz, Ender

AU - Ozev, Sule

AU - Butler, Kenneth M.

PY - 2013

Y1 - 2013

N2 - We present an adaptive test flow for mixed-signal circuits that aims at optimizing the test set on a per-device basis so that more test resources can be devoted to marginal devices while passing devices that are not marginal with less testing. Cumulative statistics of the process are monitored using a differential entropy-based approach and updated only when necessary. Thus, process shift is captured and continuously incorporated into the analysis. We also include provisions to identify potentially defective devices and test them more extensively since these devices do not conform to learned collective information. We conduct experiments on an low-noise amplifier circuit in simulations, and apply our techniques to production data of two distinct industrial circuits. Both the simulation results and the results on large-scale production data show that adaptive test provides the best tradeoff between test time and test quality as measured in terms of defective parts per million.

AB - We present an adaptive test flow for mixed-signal circuits that aims at optimizing the test set on a per-device basis so that more test resources can be devoted to marginal devices while passing devices that are not marginal with less testing. Cumulative statistics of the process are monitored using a differential entropy-based approach and updated only when necessary. Thus, process shift is captured and continuously incorporated into the analysis. We also include provisions to identify potentially defective devices and test them more extensively since these devices do not conform to learned collective information. We conduct experiments on an low-noise amplifier circuit in simulations, and apply our techniques to production data of two distinct industrial circuits. Both the simulation results and the results on large-scale production data show that adaptive test provides the best tradeoff between test time and test quality as measured in terms of defective parts per million.

KW - Adaptive test

KW - device level test adaptation

KW - growing neural networks

KW - nonlinear filtering

KW - process monitoring

KW - support vector machine (SVM)

UR - http://www.scopus.com/inward/record.url?scp=84878270367&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84878270367&partnerID=8YFLogxK

U2 - 10.1109/TVLSI.2012.2205027

DO - 10.1109/TVLSI.2012.2205027

M3 - Article

VL - 21

SP - 1116

EP - 1128

JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems

JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems

SN - 1063-8210

IS - 6

M1 - 6248732

ER -