Path-based test composition for mixed-signal SOC's

Sule Ozev, A. Orailoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We outline a methodology for system level test composition out of module level tests in the context of system-on-a-chip (SOC). The method can be utilized as soon as high level specifications are available providing avenues for testability insertion. The digital/analog interface is handled by a conversion from digital bits to analog signals. Experimental results show that high fault and yield coverages for most tests can be attained with no hardware alterations.

Original languageEnglish (US)
Title of host publication2000 Southwest Symposium on Mixed-Signal Design, SSMSD 2000
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages153-158
Number of pages6
ISBN (Print)0780359755, 9780780359758
DOIs
StatePublished - 2000
Externally publishedYes
EventSouthwest Symposium on Mixed-Signal Design, SSMSD 2000 - San Diego, United States
Duration: Feb 27 2000Feb 29 2000

Other

OtherSouthwest Symposium on Mixed-Signal Design, SSMSD 2000
CountryUnited States
CitySan Diego
Period2/27/002/29/00

ASJC Scopus subject areas

  • Signal Processing
  • Electrical and Electronic Engineering

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    Ozev, S., & Orailoglu, A. (2000). Path-based test composition for mixed-signal SOC's. In 2000 Southwest Symposium on Mixed-Signal Design, SSMSD 2000 (pp. 153-158). [836464] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SSMSD.2000.836464