Particle-Induced X-ray Emission (PIXE) of silicate coatings on high impact resistance polycarbonates

Qian Xing, M. A. Hart, Robert Culbertson, J. D. Bradley, N. Herbots, Barry J. Wilkens, David A. Sell, Clarizza Fiel Watson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Particle-Induced X-ray Emission (PIXE) analysis was employed to characterize hydroxypropyl methylcellulose (HPMC) C32 H60 O19 polymer film via areal density measurement on silicon-based substrates utilizing the differential PIXE concept, and compared with Rutherford backscattering spectrometry (RBS) results. It is demonstrated in this paper that PIXE and RBS measurements both yield comparable results for areal densities ranging from 1018 atom/cm2 to several 1019 atom/cm2. A collection of techniques including PIXE, RBS, tapping mode atomic force microscopy (TMAFM), and contact angle analysis were used to compute surface free energy, analyze surface topography and roughness parameters, determine surface composition and areal density, and to predict the water affinity and condensation behaviors of silicates and other compounds used for high impact resistance vision ware coatings. The visor surface under study is slightly hydrophilic, with root mean square of surface roughness on the order of one nm, and surface wavelength between 200 nm and 300 nm. Water condensation can be controlled on such surfaces via polymers adsorption. HPMC polymer areal density measurement supports the analysis of the surface water affinity and topography and the subsequent control of condensation behavior. HPMC film between 1018 atom/cm2 and 1019 atom/cm 2 was found to effectively alter the water condensation pattern and prevents fogging by forming a wetting layer during condensation.

Original languageEnglish (US)
Title of host publicationApplication of Accelerators in Research and Industry - Twenty-First International Conference, CAARI 2010
Pages303-309
Number of pages7
DOIs
StatePublished - Jul 14 2011
Event21st International Conference on Application of Accelerators in Research and Industry, CAARI 2010 - Fort Worth, TX, United States
Duration: Aug 8 2010Aug 13 2010

Publication series

NameAIP Conference Proceedings
Volume1336
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other21st International Conference on Application of Accelerators in Research and Industry, CAARI 2010
CountryUnited States
CityFort Worth, TX
Period8/8/108/13/10

Keywords

  • Contact angle
  • ERD
  • NRS
  • PIXE
  • Polymer
  • RBS
  • SiO
  • Silicate
  • Surface free energy
  • TMAFM

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Xing, Q., Hart, M. A., Culbertson, R., Bradley, J. D., Herbots, N., Wilkens, B. J., Sell, D. A., & Watson, C. F. (2011). Particle-Induced X-ray Emission (PIXE) of silicate coatings on high impact resistance polycarbonates. In Application of Accelerators in Research and Industry - Twenty-First International Conference, CAARI 2010 (pp. 303-309). (AIP Conference Proceedings; Vol. 1336). https://doi.org/10.1063/1.3586109