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Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices
J. Guillermin, N. Sukhaseum, A. Varotsou, A. Privat, P. Garcia, M. Vaillé, J. C. Thomas, N. Chatry, C. Poivey
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
7
Scopus
citations