Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices

J. Guillermin, N. Sukhaseum, A. Varotsou, A. Privat, P. Garcia, M. Vaillé, J. C. Thomas, N. Chatry, C. Poivey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

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