Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices

J. Guillermin, N. Sukhaseum, A. Varotsou, A. Privat, P. Garcia, M. Vaillé, J. C. Thomas, N. Chatry, C. Poivey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Process-induced variability between parts and lots is a critical issue for space applications and Radiation Hardness Assurance (RHA). The one-sided tolerance limit method is commonly used to take this variability into account. This study explores the possibility to consider a more sophisticated statistical analysis. The impact of the current trend to reduce the number of tested parts for radiation lot acceptance tests is also studied.

Original languageEnglish (US)
Title of host publication2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-8
Number of pages8
ISBN (Electronic)9781509043668
DOIs
StatePublished - Oct 31 2017
Externally publishedYes
Event16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 - Bremen, Germany
Duration: Sep 19 2016Sep 23 2016

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Volume2016-September

Other

Other16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016
CountryGermany
CityBremen
Period9/19/169/23/16

Keywords

  • linear bipolar device
  • Lot-to-lot variability
  • maximum likelihood ratio method
  • total ionizing dose

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

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