Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices

J. Guillermin; N. Sukhaseum; A. Varotsou; A. Privat; P. Garcia; M. Vaillé; J. C. Thomas; N. Chatry; C. Poivey

doi:10.1109/RADECS.2016.8093124

Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices

J. Guillermin, N. Sukhaseum, A. Varotsou, A. Privat, P. Garcia, M. Vaillé, J. C. Thomas, N. Chatry, C. Poivey

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Scopus citations

Abstract

Process-induced variability between parts and lots is a critical issue for space applications and Radiation Hardness Assurance (RHA). The one-sided tolerance limit method is commonly used to take this variability into account. This study explores the possibility to consider a more sophisticated statistical analysis. The impact of the current trend to reduce the number of tested parts for radiation lot acceptance tests is also studied.

Original language	English (US)
Title of host publication	2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-8
Number of pages	8
ISBN (Electronic)	9781509043668
DOIs	https://doi.org/10.1109/RADECS.2016.8093124
State	Published - Oct 31 2017
Externally published	Yes
Event	16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 - Bremen, Germany Duration: Sep 19 2016 → Sep 23 2016

Publication series

Name	Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Volume	2016-September

Other

Other	16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016
Country/Territory	Germany
City	Bremen
Period	9/19/16 → 9/23/16

Keywords

linear bipolar device
Lot-to-lot variability
maximum likelihood ratio method
total ionizing dose

ASJC Scopus subject areas

Electrical and Electronic Engineering
Radiation

Access to Document

10.1109/RADECS.2016.8093124

Cite this

Guillermin, J., Sukhaseum, N., Varotsou, A., Privat, A., Garcia, P., Vaillé, M., Thomas, J. C., Chatry, N., & Poivey, C. (2017). Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices. In 2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 (pp. 1-8). (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS; Vol. 2016-September). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RADECS.2016.8093124

Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices. / Guillermin, J.; Sukhaseum, N.; Varotsou, A. et al.
2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016. Institute of Electrical and Electronics Engineers Inc., 2017. p. 1-8 (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS; Vol. 2016-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Guillermin, J, Sukhaseum, N, Varotsou, A, Privat, A, Garcia, P, Vaillé, M, Thomas, JC, Chatry, N & Poivey, C 2017, Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices. in 2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016. Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS, vol. 2016-September, Institute of Electrical and Electronics Engineers Inc., pp. 1-8, 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016, Bremen, Germany, 9/19/16. https://doi.org/10.1109/RADECS.2016.8093124

Guillermin J, Sukhaseum N, Varotsou A, Privat A, Garcia P, Vaillé M et al. Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices. In 2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016. Institute of Electrical and Electronics Engineers Inc. 2017. p. 1-8. (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS). doi: 10.1109/RADECS.2016.8093124

Guillermin, J. ; Sukhaseum, N. ; Varotsou, A. et al. / Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices. 2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 1-8 (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).

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Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices

Abstract

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Keywords

ASJC Scopus subject areas

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