Parallel measurement system for the extraction of level 3 SPICE parameters

A. A. Walker, P. Touhy, A. J. Walton, J. M. Robertson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

A fast and cost-efficient system to measure level-3 SPICE parameters is described. The extraction process takes 30 measurements in 18 measurement cycles using six MOSFETS and an oxide capacitor. Many of the measurements are performed in parallel and this significantly reduces the combined measurement and extraction time.

Original languageEnglish (US)
Title of host publicationICMTS 1990 Proc 1990 Int Conf Microelecton Test Struct
Editors Anon
PublisherPubl by IEEE
Pages135-140
Number of pages6
StatePublished - 1990
Externally publishedYes
EventICMTS 1990 - Proceedings of the 1990 International Conference on Microelectronic Test Structures - San Diego, CA, USA
Duration: Mar 5 1990Mar 7 1990

Other

OtherICMTS 1990 - Proceedings of the 1990 International Conference on Microelectronic Test Structures
CitySan Diego, CA, USA
Period3/5/903/7/90

Fingerprint

SPICE
Capacitors
Oxides
Costs

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Walker, A. A., Touhy, P., Walton, A. J., & Robertson, J. M. (1990). Parallel measurement system for the extraction of level 3 SPICE parameters. In Anon (Ed.), ICMTS 1990 Proc 1990 Int Conf Microelecton Test Struct (pp. 135-140). Publ by IEEE.

Parallel measurement system for the extraction of level 3 SPICE parameters. / Walker, A. A.; Touhy, P.; Walton, A. J.; Robertson, J. M.

ICMTS 1990 Proc 1990 Int Conf Microelecton Test Struct. ed. / Anon. Publ by IEEE, 1990. p. 135-140.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Walker, AA, Touhy, P, Walton, AJ & Robertson, JM 1990, Parallel measurement system for the extraction of level 3 SPICE parameters. in Anon (ed.), ICMTS 1990 Proc 1990 Int Conf Microelecton Test Struct. Publ by IEEE, pp. 135-140, ICMTS 1990 - Proceedings of the 1990 International Conference on Microelectronic Test Structures, San Diego, CA, USA, 3/5/90.
Walker AA, Touhy P, Walton AJ, Robertson JM. Parallel measurement system for the extraction of level 3 SPICE parameters. In Anon, editor, ICMTS 1990 Proc 1990 Int Conf Microelecton Test Struct. Publ by IEEE. 1990. p. 135-140
Walker, A. A. ; Touhy, P. ; Walton, A. J. ; Robertson, J. M. / Parallel measurement system for the extraction of level 3 SPICE parameters. ICMTS 1990 Proc 1990 Int Conf Microelecton Test Struct. editor / Anon. Publ by IEEE, 1990. pp. 135-140
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