Parallel measurement system for the extraction of level 3 SPICE parameters

A. A. Walker, P. Touhy, A. J. Walton, J. M. Robertson

Research output: Contribution to conferencePaper

4 Scopus citations

Abstract

A fast and cost-efficient system to measure level-3 SPICE parameters is described. The extraction process takes 30 measurements in 18 measurement cycles using six MOSFETS and an oxide capacitor. Many of the measurements are performed in parallel and this significantly reduces the combined measurement and extraction time.

Original languageEnglish (US)
Pages135-140
Number of pages6
StatePublished - Jan 1 1990
EventICMTS 1990 - Proceedings of the 1990 International Conference on Microelectronic Test Structures - San Diego, CA, USA
Duration: Mar 5 1990Mar 7 1990

Other

OtherICMTS 1990 - Proceedings of the 1990 International Conference on Microelectronic Test Structures
CitySan Diego, CA, USA
Period3/5/903/7/90

ASJC Scopus subject areas

  • Engineering(all)

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    Walker, A. A., Touhy, P., Walton, A. J., & Robertson, J. M. (1990). Parallel measurement system for the extraction of level 3 SPICE parameters. 135-140. Paper presented at ICMTS 1990 - Proceedings of the 1990 International Conference on Microelectronic Test Structures, San Diego, CA, USA, .