Abstract
A fast and cost-efficient system to measure level-3 SPICE parameters is described. The extraction process takes 30 measurements in 18 measurement cycles using six MOSFETS and an oxide capacitor. Many of the measurements are performed in parallel and this significantly reduces the combined measurement and extraction time.
Original language | English (US) |
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Pages | 135-140 |
Number of pages | 6 |
State | Published - 1990 |
Externally published | Yes |
Event | ICMTS 1990 - Proceedings of the 1990 International Conference on Microelectronic Test Structures - San Diego, CA, USA Duration: Mar 5 1990 → Mar 7 1990 |
Other
Other | ICMTS 1990 - Proceedings of the 1990 International Conference on Microelectronic Test Structures |
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City | San Diego, CA, USA |
Period | 3/5/90 → 3/7/90 |
ASJC Scopus subject areas
- General Engineering