P-21: Integrated source drivers for electrophoretic displays using low temperature IZO TFTs

Sameer M. Venugopal, Michael Marrs, David Allee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A low temperature (180°C) Indium Zinc Oxide thin film transistor process compatible with flexible substrates and integrated source drivers for electrophoretic displays using these IZO TFTs has been developed at the Flexible Display Center. Initial stress tests show improved threshold voltage stability compared to amorphous silicon TFTs.

Original languageEnglish (US)
Title of host publication48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010
Pages1301-1303
Number of pages3
StatePublished - Dec 1 2010
Event48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010 - Seattle, WA, United States
Duration: May 23 2010May 28 2010

Publication series

Name48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010
Volume3

Other

Other48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010
CountryUnited States
CitySeattle, WA
Period5/23/105/28/10

ASJC Scopus subject areas

  • Hardware and Architecture
  • Information Systems

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  • Cite this

    Venugopal, S. M., Marrs, M., & Allee, D. (2010). P-21: Integrated source drivers for electrophoretic displays using low temperature IZO TFTs. In 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010 (pp. 1301-1303). (48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010; Vol. 3).