Oxygen vacancies at grain boundaries in doubly-doped ceria determined using EELS

W. J. Bowman, J. Zhu, Z. Hussaini, Peter Crozier

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1926-1927
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014

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Electron energy loss spectroscopy
Cerium compounds
Oxygen vacancies
Grain boundaries
grain boundaries
oxygen

ASJC Scopus subject areas

  • Instrumentation

Cite this

Oxygen vacancies at grain boundaries in doubly-doped ceria determined using EELS. / Bowman, W. J.; Zhu, J.; Hussaini, Z.; Crozier, Peter.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 1926-1927.

Research output: Contribution to journalArticle

Bowman, W. J. ; Zhu, J. ; Hussaini, Z. ; Crozier, Peter. / Oxygen vacancies at grain boundaries in doubly-doped ceria determined using EELS. In: Microscopy and Microanalysis. 2014 ; Vol. 20, No. 3. pp. 1926-1927.
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