Oxygen self-diffusion in single-crystal MgO: Secondary-ion mass spectrometric analysis with comparison of results from gas-solid and solid-solid exchange

Han Ill Yoo, Bernhardt J. Wuensch, William Petuskey

Research output: Contribution to journalArticle

18 Scopus citations

Abstract

Self-diffusion coefficients for 18O in single-crystal MgO have been determined from a novel specimen comprising an epitaxial layer of high-purity Mg18O upon a single crystal substrate of normal MgO. Heating the specimen in air produced a gas-solid exchange gradient at the sample surface as 18O in the epitaxial layer exchanged with 16O in air. A solid-solid interdiffusion gradient was produced between the substrate crystal and the 18O-enriched epitaxial layer. SIMS analysis of gas-solid exchange gradients prepared in the temperature range 1000-1650 °C provided diffusion coefficients that could be described as D/(m2s-1) = (1.8-1.1+2.9) × 10-10exp[-(3.24±0.13)eV/kT]. Interdiffusion gradients produced by annealing at 1100 and 1200 °C yielded the self-diffusion coefficients that were comparable to those obtained from gas-solid exchange, indicating that the surface exchange reaction is fast enough. The results are interpreted in terms of a defect model in which oxygen diffusion occurs by an interstitial type of defect as a result of suppression of anion vacancy concentration by large concentrations of extrinsic cation vacancies.

Original languageEnglish (US)
Pages (from-to)207-221
Number of pages15
JournalSolid State Ionics
Volume150
Issue number3-4
DOIs
StatePublished - Oct 1 2002

Keywords

  • Oxygen self-diffusion
  • Secondary-ion mass spectrometric analysis
  • Single-crystal MgO

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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