We model velocity overshoot in GaAs and InP using a fullband, particle-based device simulator based on the so-called cellular automaton method. This study has been motivated by the recent availability of experimental measures of the THz radiation generated by transient acceleration of photogenerated charge carriers in pin diode structures. The fullband code used in this study includes the full energy-momentum dispersion relation of electrons and holes as well as the full dispersion for the relevant phonons. Here we use this code for the simulation of high-field transient transport in bulk GaAs, InP, and for the experimental pin structure, where favorable comparison is found with the velocities measured from the transient THz radiatn after ultrafast excitation.
- Charge transport modeling
- Monte Carlo
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering