@inproceedings{d7b9d0dc33934d3ba9161c40992fc76b,
title = "Origins of high spatial resolution secondary electron microscopy",
abstract = "The secondary electron generation process is studied in an ultra-high vacuum scanning transmission electron microscope using electron coincidence spectroscopy. Production pathways for secondary electrons are determined by analyzing coincidences between secondary electrons and individual excitation events. The ultimate spatial resolution available in scanning electron microscopy is limited by the delocalization of the secondary electron generation process. This delocalization is studied using momentum resolved coincidence electron spectroscopy. The fraction of secondary electrons resulting from localized excitations can explain the high spatial resolution observed in secondary electron microscopy images.",
author = "Scheinfein, {M. R.} and Jeffery Drucker and Jingyue Liu and Weiss, {J. K.} and Hembree, {G. G.} and Cowley, {J. M.}",
year = "1993",
month = jan,
day = "1",
language = "English (US)",
isbn = "1558991905",
series = "Materials Research Society Symposium Proceedings",
publisher = "Publ by Materials Research Society",
pages = "253--259",
booktitle = "Materials Research Society Symposium Proceedings",
note = "Symposium on Atomic-scale Imaging of Surfaces and Interfaces ; Conference date: 30-11-1992 Through 02-12-1992",
}