Origin of the alternate bright/dark contrast in HREM images of hexagonal crystals, particularly 6H-SiC

J. S. Bow, Ray Carpenter, M. J. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The effects of crystal tilt on HREM images of crystals with hexagonal structure by crystal model construction and high resolution image simulation performed in the CERIUS 3.1 program. Some simulated images of 6H-SiC crystals with different tilting angles and tilting azimuths were shown. All images showed characteristics of alternate bright/dark contrast except for those tilted toward [0001] direction. The crystal model showed that the relative positions of carbon atoms with respect to the closest Si atom switch for every three (0006) planes, and that other hexagonal compounds show properties similar to 6H-SiC.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages914-915
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Bow, J. S., Carpenter, R., & Kim, M. J. (1993). Origin of the alternate bright/dark contrast in HREM images of hexagonal crystals, particularly 6H-SiC. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 914-915). Publ by San Francisco Press Inc.