Origin of the alternate bright/dark contrast in HREM images of hexagonal crystals, particularly 6H-SiC

J. S. Bow, Ray Carpenter, M. J. Kim

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Scopus citations

    Abstract

    The effects of crystal tilt on HREM images of crystals with hexagonal structure by crystal model construction and high resolution image simulation performed in the CERIUS 3.1 program. Some simulated images of 6H-SiC crystals with different tilting angles and tilting azimuths were shown. All images showed characteristics of alternate bright/dark contrast except for those tilted toward [0001] direction. The crystal model showed that the relative positions of carbon atoms with respect to the closest Si atom switch for every three (0006) planes, and that other hexagonal compounds show properties similar to 6H-SiC.

    Original languageEnglish (US)
    Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
    PublisherPubl by San Francisco Press Inc
    Pages914-915
    Number of pages2
    StatePublished - 1993
    EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
    Duration: Aug 1 1993Aug 6 1993

    Other

    OtherProceedings of the 51st Annual Meeting Microscopy Society of America
    CityCincinnati, OH, USA
    Period8/1/938/6/93

    ASJC Scopus subject areas

    • General Engineering

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