Optimizing radiation hard by design SRAM cells

Lawrence T. Clark, Karl C. Mohr, Keith Holbert, Xiaoyin Yao, Jonathan Knudsen, Harshit Shah

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

Various radiation hardened by design SRAM cells are explored for their size, electrical performance, and total ionizing dose (TID) immunity. TID experiments using Co-60 testing on 130-and 90-nm transistors and SRAM arrays show that SRAM cells using two-edge transistors, NMOS access transistors, and NMOS reverse-body-bias effectively mitigate TID in both generations. This work experimentally demonstrates that commercial foundry (optimally sized) SRAM cells can be used in radiation hardening by design if NMOS reverse-body bias is used for TID mitigation.

Original languageEnglish (US)
Pages (from-to)2028-2036
Number of pages9
JournalIEEE Transactions on Nuclear Science
Volume54
Issue number6
DOIs
StatePublished - Dec 2007

Keywords

  • Integrated circuit radiation effects
  • Radiation hardening
  • SRAM

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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