Optimized EVM testing for IEEE 802.11a/n RF ICs

Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

10 Scopus citations

Fingerprint

Dive into the research topics of 'Optimized EVM testing for IEEE 802.11a/n RF ICs'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science