TY - GEN
T1 - Optimized EVM testing for IEEE 802.11a/n RF ICs
AU - Acar, Erkan
AU - Ozev, Sule
AU - Srinivasan, Ganesh
AU - Taenzler, Friedrich
PY - 2008
Y1 - 2008
N2 - Characterization of RF ICs based on their error vector magnitude (EVM) is gaining a lot of attention in the industry. In order to deliver this specification at a reasonable cost, the input test signal and the analysis techniques have to be optimized such that EVM testing can provide a robust pass/fail decision while utilizing a reasonable amount of tester resources. In this paper, we propose techniques to optimize EVM testing, both from input signal generation and from output analysis perspectives. Our goal is to achieve both efficient and reliable test approaches for WLAN (Wireless Local Area Networks) circuits.
AB - Characterization of RF ICs based on their error vector magnitude (EVM) is gaining a lot of attention in the industry. In order to deliver this specification at a reasonable cost, the input test signal and the analysis techniques have to be optimized such that EVM testing can provide a robust pass/fail decision while utilizing a reasonable amount of tester resources. In this paper, we propose techniques to optimize EVM testing, both from input signal generation and from output analysis perspectives. Our goal is to achieve both efficient and reliable test approaches for WLAN (Wireless Local Area Networks) circuits.
UR - http://www.scopus.com/inward/record.url?scp=67249107478&partnerID=8YFLogxK
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U2 - 10.1109/TEST.2008.4700602
DO - 10.1109/TEST.2008.4700602
M3 - Conference contribution
AN - SCOPUS:67249107478
SN - 9781424424030
T3 - Proceedings - International Test Conference
BT - Proceedings - International Test Conference 2008, ITC 2008
T2 - International Test Conference 2008, ITC 2008
Y2 - 28 October 2008 through 30 October 2008
ER -