Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope

David J. Smith, R. A. Camps, V. E. Cosslett, L. A. Freeman, W. O. Saxton, W. C. Nixon, H. Ahmed, C. J.D. Catto, J. R.A. Cleaver, K. C.A. Smith, A. E. Timbs

Research output: Contribution to journalArticlepeer-review

43 Scopus citations

Abstract

The Cambridge University 600 kV high resolution electron microscope is currently operating with a directly interpretable image resolution of close to 2 Å. Following a brief outline of salient features of this HREM which have proven crucial to optimising its performance, details are given of methods whereby such high resolution levels are now obtainable on a routine basis. Some recent applications are also described. The success of these studies confirms that electron microscopy at the atomic resolution level will have an increasing impact in many areas of materials research.

Original languageEnglish (US)
Pages (from-to)203-213
Number of pages11
JournalUltramicroscopy
Volume9
Issue number3
DOIs
StatePublished - 1982
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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