Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope

David Smith, R. A. Camps, V. E. Cosslett, L. A. Freeman, W. O. Saxton, W. C. Nixon, H. Ahmed, C. J D Catto, J. R A Cleaver, K. C A Smith, A. E. Timbs

Research output: Contribution to journalArticle

43 Citations (Scopus)

Abstract

The Cambridge University 600 kV high resolution electron microscope is currently operating with a directly interpretable image resolution of close to 2 Å. Following a brief outline of salient features of this HREM which have proven crucial to optimising its performance, details are given of methods whereby such high resolution levels are now obtainable on a routine basis. Some recent applications are also described. The success of these studies confirms that electron microscopy at the atomic resolution level will have an increasing impact in many areas of materials research.

Original languageEnglish (US)
Pages (from-to)203-213
Number of pages11
JournalUltramicroscopy
Volume9
Issue number3
DOIs
StatePublished - 1982
Externally publishedYes

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High resolution electron microscopy
Image resolution
Electron microscopy
Electron microscopes
electron microscopes
optimization
high resolution
image resolution
electron microscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Smith, D., Camps, R. A., Cosslett, V. E., Freeman, L. A., Saxton, W. O., Nixon, W. C., ... Timbs, A. E. (1982). Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope. Ultramicroscopy, 9(3), 203-213. https://doi.org/10.1016/0304-3991(82)90201-7

Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope. / Smith, David; Camps, R. A.; Cosslett, V. E.; Freeman, L. A.; Saxton, W. O.; Nixon, W. C.; Ahmed, H.; Catto, C. J D; Cleaver, J. R A; Smith, K. C A; Timbs, A. E.

In: Ultramicroscopy, Vol. 9, No. 3, 1982, p. 203-213.

Research output: Contribution to journalArticle

Smith, D, Camps, RA, Cosslett, VE, Freeman, LA, Saxton, WO, Nixon, WC, Ahmed, H, Catto, CJD, Cleaver, JRA, Smith, KCA & Timbs, AE 1982, 'Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope', Ultramicroscopy, vol. 9, no. 3, pp. 203-213. https://doi.org/10.1016/0304-3991(82)90201-7
Smith, David ; Camps, R. A. ; Cosslett, V. E. ; Freeman, L. A. ; Saxton, W. O. ; Nixon, W. C. ; Ahmed, H. ; Catto, C. J D ; Cleaver, J. R A ; Smith, K. C A ; Timbs, A. E. / Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope. In: Ultramicroscopy. 1982 ; Vol. 9, No. 3. pp. 203-213.
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