Optimal sensor placement for active guided wave interrogation of complex metallic components

Clyde K. Coelho, Seung Bum Kim, Aditi Chattopadhyay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

With research in structural health monitoring (SHM) moving towards increasingly complex structures for damage interrogation, the placement of sensors is becoming a key issue in the performance of the damage detection methodologies. For ultrasonic wave based approaches, this is especially important because of the sensitivity of the travelling Lamb waves to material properties, geometry and boundary conditions that may obscure the presence of damage if they are not taken into account during sensor placement. The framework proposed in this paper defines a sensing region for a pair of piezoelectric transducers in a pitch-catch damage detection approach by taking into account the material attenuation and probability of false alarm. Using information about the region interrogated by a sensoractuator pair, a simulated annealing optimization framework was implemented in order to place sensors on complex metallic geometries such that a selected minimum damage type and size could be detected with an acceptable probability of false alarm anywhere on the structure. This approach was demonstrated on a lug joint to detect a crack and on a large Naval SHM test bed and resulted in a placement of sensors that was able to interrogate all parts of the structure using the minimum number of transducers.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7981
DOIs
StatePublished - 2011
EventSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2011 - San Diego, CA, United States
Duration: Mar 7 2011Mar 10 2011

Other

OtherSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2011
CountryUnited States
CitySan Diego, CA
Period3/7/113/10/11

Fingerprint

Sensor Placement
Guided Waves
Guided electromagnetic wave propagation
interrogation
Damage Detection
Damage
False Alarm
Health Monitoring
damage
Transducer
Sensor
Placement
Damage detection
Structural health monitoring
sensors
Sensors
structural health monitoring
false alarms
Lamb Waves
Ultrasonic Wave

Keywords

  • attenuation
  • guided wave
  • Lamb wave
  • mode conversion
  • Optimal sensor placement
  • sensing region
  • simulated annealing

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Coelho, C. K., Kim, S. B., & Chattopadhyay, A. (2011). Optimal sensor placement for active guided wave interrogation of complex metallic components. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7981). [79813O] https://doi.org/10.1117/12.880288

Optimal sensor placement for active guided wave interrogation of complex metallic components. / Coelho, Clyde K.; Kim, Seung Bum; Chattopadhyay, Aditi.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7981 2011. 79813O.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Coelho, CK, Kim, SB & Chattopadhyay, A 2011, Optimal sensor placement for active guided wave interrogation of complex metallic components. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7981, 79813O, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2011, San Diego, CA, United States, 3/7/11. https://doi.org/10.1117/12.880288
Coelho CK, Kim SB, Chattopadhyay A. Optimal sensor placement for active guided wave interrogation of complex metallic components. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7981. 2011. 79813O https://doi.org/10.1117/12.880288
Coelho, Clyde K. ; Kim, Seung Bum ; Chattopadhyay, Aditi. / Optimal sensor placement for active guided wave interrogation of complex metallic components. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7981 2011.
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