Optimal Pulse Processing, Pile-Up Decomposition, and Applications of Silicon Drift Detectors at LCLS

G. Blaj, C. J. Kenney, A. Dragone, G. Carini, S. Herrmann, P. Hart, A. Tomada, J. Koglin, G. Haller, S. Boutet, M. Messerschmidt, G. Williams, M. Chollet, G. Dakovski, S. Nelson, J. Pines, S. Song, J. Thayer

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Silicon drift detectors (SDDs) revolutionized spectroscopy in fields as diverse as geology and dentistry. For a subset of experiments at ultrafast, X-ray free-electron lasers (FELs), SDDs can make substantial contributions. Often the unknown spectrum is interesting, carrying science data, or the background measurement is useful to identify unexpected signals. Many measurements involve only several discrete photon energies known a priori, allowing single-event decomposition of pile-up and spectroscopic photon counting. We designed a pulse function and demonstrated that the signal amplitude (i.e., proportional to the detected energy and obtained from fitting with the pulse function), rise time, and pulse height are interrelated, and at short peaking times, the pulse height and pulse area are not optimal estimators for detected energy; instead, the signal amplitude and rise time are obtained for each pulse by fitting, thus removing the need for pulse shaping. By avoiding pulse shaping, rise times of tens of nanoseconds resulted in reduced pulse pile-up and allowed decomposition of remaining pulse pile-up at photon separation times down to hundreds of nanoseconds while yielding time-of-arrival information with the precision of 10 ns. Waveform fitting yields simultaneously high energy resolution and high counting rates (two orders of magnitude higher than current digital pulse processors). At pulsed sources or high photon rates, photon pile-up still occurs. We showed that pile-up spectrum fitting is relatively simple and preferable to pile-up spectrum deconvolution. We developed a photon pile-up statistical model for constant intensity sources, extended it to variable intensity sources (typical for FELs), and used it to fit a complex pile-up spectrum. We subsequently developed a Bayesian pile-up decomposition method that allows decomposing pile-up of single events with up to six photons from six monochromatic lines with 99% accuracy. The usefulness of SDDs will continue into the X-ray FEL era of science. Their successors, the ePixS hybrid pixel detectors, already offer hundreds of pixels, each with a similar performance to an SDD, in a compact, robust and affordable package.

Original languageEnglish (US)
Article number8064694
Pages (from-to)2854-2868
Number of pages15
JournalIEEE Transactions on Nuclear Science
Volume64
Issue number11
DOIs
StatePublished - Nov 2017

Keywords

  • Bayesian decomposition
  • X-ray spectroscopy
  • free-electron lasers (FELs)
  • photon counting
  • photon pile-up
  • pulse pile-up
  • pulse processing
  • silicon drift detectors (SDDs)

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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