Optimal planning and inference for sequential accelerated life testing with two or more experimental factors

Arun Bala Subramaniyan, Rong Pan, Wendai Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An important task before conducting Accelerated Life Testing (ALT) experiments is to specify a prior lifetime model, based on the historical data of similar products or expert opinions. The initial estimates of model parameters need to be reasonable so that the test plan can produce sufficient failure data. Though many methods have been developed to design test plans with unknown prior distributions, there is still active research in this area to obtain the best value of the final parameter estimates. A main drawback is that, in most cases, these ALT test plans consider only one stage of experimentation, which is often inadequate for building a reasonable prediction model. In this paper, we propose a modified version of sequential ALT planning and life quantile prediction framework involving multiple factors. The first stage of design is carried out based on the prior knowledge of various possible acceleration regression models for a limited testing time and experimenting at more than one level for at least one factor, followed by an adaptive second-stage ALT test planned under the given budget to improve the prediction accuracy obtained from the first stage. The proposed approach is validated through real accelerated life testing data of Multi-Layer Ceramic Capacitor (MLCC) data involving three factors: Temperature, humidity and voltage.

Original languageEnglish (US)
Title of host publicationRAMS 2019 - 2019 Annual Reliability and Maintainability Symposium, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538665541
DOIs
StatePublished - Jan 1 2019
Event2019 Annual Reliability and Maintainability Symposium, RAMS 2019 - Orlando, United States
Duration: Jan 28 2019Jan 31 2019

Publication series

NameProceedings - Annual Reliability and Maintainability Symposium
Volume2019-January
ISSN (Print)0149-144X

Conference

Conference2019 Annual Reliability and Maintainability Symposium, RAMS 2019
CountryUnited States
CityOrlando
Period1/28/191/31/19

Keywords

  • Accelerated Life Testing
  • Multi-Layer Ceramic Capacitor Reliability
  • Sequential ALT design

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Mathematics(all)
  • Computer Science Applications

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