Optimal guard bands for gauges in series

Daniel R. McCarville, Douglas Montgomery

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

In many manufacturing settings, a series of gauges is used to screen product before it is shipped to the customer. Semiconductor manufacturing is an example of an industry where this type of serial inspection is used. A common problem is determining the target for each gauge so that gauge losses (good units classified as defective by the system of gauges) and defect levels (defective units passed by the system of gauges and sent to the customer) are at appropriate levels. These gauge targets are called guard bands. This article develops general models for defect levels and gauge losses for systems of gauges and shows how response surface models can be used to optimize the system by appropriate selection of the guard bands.

Original languageEnglish (US)
Pages (from-to)167-177
Number of pages11
JournalQuality Engineering
Volume9
Issue number2
StatePublished - 1996

Fingerprint

Gages
Defects
Inspection
Semiconductor materials
Industry

Keywords

  • Gauge error
  • Guard bands
  • Measurement precision
  • Response surface methodology

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

Cite this

Optimal guard bands for gauges in series. / McCarville, Daniel R.; Montgomery, Douglas.

In: Quality Engineering, Vol. 9, No. 2, 1996, p. 167-177.

Research output: Contribution to journalArticle

McCarville, DR & Montgomery, D 1996, 'Optimal guard bands for gauges in series', Quality Engineering, vol. 9, no. 2, pp. 167-177.
McCarville, Daniel R. ; Montgomery, Douglas. / Optimal guard bands for gauges in series. In: Quality Engineering. 1996 ; Vol. 9, No. 2. pp. 167-177.
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