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Dive into the research topics of 'Optical investigation of strain and defects in (100) CdTe/Ge/Si and ZnTe/Ge/Si grown by molecular beam epitaxy'. Together they form a unique fingerprint.- Sort by
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J. W. Hutchins, Brian Skromme, Y. P. Chen, S. Sivananthan, J. B. Posthill
Research output: Contribution to journal › Article › peer-review