Optical investigation of strain and defects in (100) CdTe/Ge/Si and ZnTe/Ge/Si grown by molecular beam epitaxy

J. W. Hutchins, Brian Skromme, Y. P. Chen, S. Sivananthan, J. B. Posthill

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

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Physics & Astronomy