Abstract
Bulk GaN crystals up to several mm in size, grown by a Na/Ga flux method, have been characterized using room and low temperature photoluminescence (PL) and panchromatic cathodoluminescence (CL) imaging. Highly resolved excitonic PL spectra are obtained for material grown in a new, large-scale reactor. The crystal polarity affects the incorporation of residual Zn and Mg or Si acceptors and the deep level luminescence bands in c-oriented platelets. A Zn (A°,X) triplet structure with unusual thermalization properties and a highly resolved structural defect related PL peak are observed. Striations are found in some of the smaller platelets by CL imaging, but are absent in the prismatic crystals.
Original language | English (US) |
---|---|
Title of host publication | Materials Research Society Symposium - Proceedings |
Editors | C. Wetzel, E.T. Yu, J.S. Speck, A. Rizzi, Y. Arakawa |
Pages | 201-206 |
Number of pages | 6 |
Volume | 743 |
State | Published - 2002 |
Event | Gan and Related Alloys - 2002 - Boston, MA, United States Duration: Dec 2 2002 → Dec 6 2002 |
Other
Other | Gan and Related Alloys - 2002 |
---|---|
Country/Territory | United States |
City | Boston, MA |
Period | 12/2/02 → 12/6/02 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials