Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells

Laura Ding, Stephen P. Harvey, Glenn Teeter, Mariana Bertoni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier- selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.

Original languageEnglish (US)
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781509056057
DOIs
StatePublished - 2017
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: Jun 25 2017Jun 30 2017

Publication series

Name2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
Country/TerritoryUnited States
CityWashington
Period6/25/176/30/17

Keywords

  • Carrier-selective contact
  • Operando
  • Silicon solar cell
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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