Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells

Laura Ding, Stephen P. Harvey, Glenn Teeter, Mariana Bertoni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier- selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.

Original languageEnglish (US)
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781509056057
DOIs
StatePublished - May 25 2018
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: Jun 25 2017Jun 30 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
CountryUnited States
CityWashington
Period6/25/176/30/17

Fingerprint

Molybdenum oxide
Silicon
Heterojunctions
Solar cells
X ray photoelectron spectroscopy
Crystalline materials
Chemical properties

Keywords

  • Carrier-selective contact
  • Operando
  • Silicon solar cell
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Ding, L., Harvey, S. P., Teeter, G., & Bertoni, M. (2018). Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1-4). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366839

Operando XPS characterization of selective contacts : The case of molybdenum oxide for crystalline silicon heterojunction solar cells. / Ding, Laura; Harvey, Stephen P.; Teeter, Glenn; Bertoni, Mariana.

2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-4.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ding, L, Harvey, SP, Teeter, G & Bertoni, M 2018, Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., pp. 1-4, 44th IEEE Photovoltaic Specialist Conference, PVSC 2017, Washington, United States, 6/25/17. https://doi.org/10.1109/PVSC.2017.8366839
Ding L, Harvey SP, Teeter G, Bertoni M. Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1-4 https://doi.org/10.1109/PVSC.2017.8366839
Ding, Laura ; Harvey, Stephen P. ; Teeter, Glenn ; Bertoni, Mariana. / Operando XPS characterization of selective contacts : The case of molybdenum oxide for crystalline silicon heterojunction solar cells. 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1-4
@inproceedings{f47e7c26899b4b0e9e32c81e5f8d573d,
title = "Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells",
abstract = "We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier- selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.",
keywords = "Carrier-selective contact, Operando, Silicon solar cell, X-ray photoelectron spectroscopy",
author = "Laura Ding and Harvey, {Stephen P.} and Glenn Teeter and Mariana Bertoni",
year = "2018",
month = "5",
day = "25",
doi = "10.1109/PVSC.2017.8366839",
language = "English (US)",
pages = "1--4",
booktitle = "2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - Operando XPS characterization of selective contacts

T2 - The case of molybdenum oxide for crystalline silicon heterojunction solar cells

AU - Ding, Laura

AU - Harvey, Stephen P.

AU - Teeter, Glenn

AU - Bertoni, Mariana

PY - 2018/5/25

Y1 - 2018/5/25

N2 - We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier- selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.

AB - We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier- selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.

KW - Carrier-selective contact

KW - Operando

KW - Silicon solar cell

KW - X-ray photoelectron spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=85048504633&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85048504633&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2017.8366839

DO - 10.1109/PVSC.2017.8366839

M3 - Conference contribution

AN - SCOPUS:85048504633

SP - 1

EP - 4

BT - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

PB - Institute of Electrical and Electronics Engineers Inc.

ER -