Online monitoring in the upcoming Fermilab Tevatron runII

P. Canal, J. Kowalkowski, K. Maeshima, J. Yu, H. Wenzel, J. Snow, T. Arisawa, K. Ikado, M. Shimojima, G. Veramendi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We describe the online event monitoring systems using ROOT for the CDF and DO collaborations in the upcoming Fermilab Tevatron runII. The CDF and DO experiments consist of many detector subsystems and will run in a high rate large bandwidth data transfer environment. In the experiments, it is crucial to monitor the performance of each subsystem and the integrity of the data, in real time with minimal interruption. ROOT is used as the main analysis tool for the monitoring systems and its GUI is used to browse the results via socket, allowing multiple GUI client connections.

Original languageEnglish (US)
Title of host publicationSANTA FE 1999 - 11th IEEE NPSS Real Time Conference, Conference Record, RT 1999
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages291-294
Number of pages4
ISBN (Electronic)078035463X, 9780780354630
DOIs
StatePublished - Jan 1 1999
Externally publishedYes
Event11th IEEE NPSS Real Time Conference - Computer Applications in Nuclear Particle and Plasma Physics, RT 1999 - Santa Fe, United States
Duration: Jun 14 1999Jun 18 1999

Other

Other11th IEEE NPSS Real Time Conference - Computer Applications in Nuclear Particle and Plasma Physics, RT 1999
CountryUnited States
CitySanta Fe
Period6/14/996/18/99

    Fingerprint

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Radiology Nuclear Medicine and imaging
  • Nuclear and High Energy Physics
  • Computer Science Applications

Cite this

Canal, P., Kowalkowski, J., Maeshima, K., Yu, J., Wenzel, H., Snow, J., Arisawa, T., Ikado, K., Shimojima, M., & Veramendi, G. (1999). Online monitoring in the upcoming Fermilab Tevatron runII. In SANTA FE 1999 - 11th IEEE NPSS Real Time Conference, Conference Record, RT 1999 (pp. 291-294). [842623] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RTCON.1999.842623