Online Built-In Self-Test of High Switching Frequency DC-DC Converters Using Model Reference Based System Identification Techniques

Navankur Beohar, Venkata N.K. Malladi, Debashis Mandal, Sule Ozev, Bertan Bakkaloglu

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

A built-in self-test (BIST) technique that enables tracking of loop parameters of integrated DC-DC converters without affecting the normal mode of operation is presented. A digital pseudo-noise based stimulus and a mixed signal cross-correlation based analysis technique is used to derive on-chip impulse response, with minimum computational requirements in comparison to a digital correlator approach. Using measured impulse response, open-loop phase margin and closed-loop unity-gain frequency are estimated within 5.2% and 4.1% error, respectively, for the load current range of 30 mA to 200 mA. Converter parameters, such as natural frequency, $Q$-factor, and center frequency are estimated within 3.6%, 4.7%, and 3.8% error, respectively, over load inductance of 4.7 μH to 10.3 μH, and filter capacitance of 200 nF to 400 nF. A 5 MHz switching frequency, 5 V to 8.125 V input voltage range, voltage-mode controlled DC-DC buck converter is designed for the proposed model reference based parametric and non-parametric BIST analysis. The converter output voltage range is 3.3 V to 5 V and supported maximum load current is 450 mA with a peak efficiency of 87.93%. The proposed converter is fabricated on a 0.6 μm 6 layer-metal SOI technology with a die area of 9 mm². The system identification circuitry occupies 3.8% of the converter area with 530 μA quiescent current during operation.

Original languageEnglish (US)
JournalIEEE Transactions on Circuits and Systems I: Regular Papers
DOIs
StateAccepted/In press - Aug 30 2017

Fingerprint

Built-in self test
Switching frequency
DC-DC converters
Identification (control systems)
Impulse response
Electric potential
Correlators
Inductance
Natural frequencies
Capacitance
Metals

Keywords

  • Analog BIST
  • DC-DC power converters
  • frequency response
  • impulse response
  • parameter estimation
  • pulse width modulation (PWM)
  • switched capacitor
  • white noise.

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

@article{97bba0a5bf244a0ea5d0769ed6b3f0cb,
title = "Online Built-In Self-Test of High Switching Frequency DC-DC Converters Using Model Reference Based System Identification Techniques",
abstract = "A built-in self-test (BIST) technique that enables tracking of loop parameters of integrated DC-DC converters without affecting the normal mode of operation is presented. A digital pseudo-noise based stimulus and a mixed signal cross-correlation based analysis technique is used to derive on-chip impulse response, with minimum computational requirements in comparison to a digital correlator approach. Using measured impulse response, open-loop phase margin and closed-loop unity-gain frequency are estimated within 5.2{\%} and 4.1{\%} error, respectively, for the load current range of 30 mA to 200 mA. Converter parameters, such as natural frequency, $Q$-factor, and center frequency are estimated within 3.6{\%}, 4.7{\%}, and 3.8{\%} error, respectively, over load inductance of 4.7 μH to 10.3 μH, and filter capacitance of 200 nF to 400 nF. A 5 MHz switching frequency, 5 V to 8.125 V input voltage range, voltage-mode controlled DC-DC buck converter is designed for the proposed model reference based parametric and non-parametric BIST analysis. The converter output voltage range is 3.3 V to 5 V and supported maximum load current is 450 mA with a peak efficiency of 87.93{\%}. The proposed converter is fabricated on a 0.6 μm 6 layer-metal SOI technology with a die area of 9 mm². The system identification circuitry occupies 3.8{\%} of the converter area with 530 μA quiescent current during operation.",
keywords = "Analog BIST, DC-DC power converters, frequency response, impulse response, parameter estimation, pulse width modulation (PWM), switched capacitor, white noise.",
author = "Navankur Beohar and Malladi, {Venkata N.K.} and Debashis Mandal and Sule Ozev and Bertan Bakkaloglu",
year = "2017",
month = "8",
day = "30",
doi = "10.1109/TCSI.2017.2739479",
language = "English (US)",
journal = "IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications",
issn = "1549-8328",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Online Built-In Self-Test of High Switching Frequency DC-DC Converters Using Model Reference Based System Identification Techniques

AU - Beohar, Navankur

AU - Malladi, Venkata N.K.

AU - Mandal, Debashis

AU - Ozev, Sule

AU - Bakkaloglu, Bertan

PY - 2017/8/30

Y1 - 2017/8/30

N2 - A built-in self-test (BIST) technique that enables tracking of loop parameters of integrated DC-DC converters without affecting the normal mode of operation is presented. A digital pseudo-noise based stimulus and a mixed signal cross-correlation based analysis technique is used to derive on-chip impulse response, with minimum computational requirements in comparison to a digital correlator approach. Using measured impulse response, open-loop phase margin and closed-loop unity-gain frequency are estimated within 5.2% and 4.1% error, respectively, for the load current range of 30 mA to 200 mA. Converter parameters, such as natural frequency, $Q$-factor, and center frequency are estimated within 3.6%, 4.7%, and 3.8% error, respectively, over load inductance of 4.7 μH to 10.3 μH, and filter capacitance of 200 nF to 400 nF. A 5 MHz switching frequency, 5 V to 8.125 V input voltage range, voltage-mode controlled DC-DC buck converter is designed for the proposed model reference based parametric and non-parametric BIST analysis. The converter output voltage range is 3.3 V to 5 V and supported maximum load current is 450 mA with a peak efficiency of 87.93%. The proposed converter is fabricated on a 0.6 μm 6 layer-metal SOI technology with a die area of 9 mm². The system identification circuitry occupies 3.8% of the converter area with 530 μA quiescent current during operation.

AB - A built-in self-test (BIST) technique that enables tracking of loop parameters of integrated DC-DC converters without affecting the normal mode of operation is presented. A digital pseudo-noise based stimulus and a mixed signal cross-correlation based analysis technique is used to derive on-chip impulse response, with minimum computational requirements in comparison to a digital correlator approach. Using measured impulse response, open-loop phase margin and closed-loop unity-gain frequency are estimated within 5.2% and 4.1% error, respectively, for the load current range of 30 mA to 200 mA. Converter parameters, such as natural frequency, $Q$-factor, and center frequency are estimated within 3.6%, 4.7%, and 3.8% error, respectively, over load inductance of 4.7 μH to 10.3 μH, and filter capacitance of 200 nF to 400 nF. A 5 MHz switching frequency, 5 V to 8.125 V input voltage range, voltage-mode controlled DC-DC buck converter is designed for the proposed model reference based parametric and non-parametric BIST analysis. The converter output voltage range is 3.3 V to 5 V and supported maximum load current is 450 mA with a peak efficiency of 87.93%. The proposed converter is fabricated on a 0.6 μm 6 layer-metal SOI technology with a die area of 9 mm². The system identification circuitry occupies 3.8% of the converter area with 530 μA quiescent current during operation.

KW - Analog BIST

KW - DC-DC power converters

KW - frequency response

KW - impulse response

KW - parameter estimation

KW - pulse width modulation (PWM)

KW - switched capacitor

KW - white noise.

UR - http://www.scopus.com/inward/record.url?scp=85028724625&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85028724625&partnerID=8YFLogxK

U2 - 10.1109/TCSI.2017.2739479

DO - 10.1109/TCSI.2017.2739479

M3 - Article

JO - IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

JF - IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

SN - 1549-8328

ER -